{"created":"2023-06-20T15:03:17.006205+00:00","id":32448,"links":{},"metadata":{"_buckets":{"deposit":"f7a1a15a-8af2-4d01-8a3f-408ab7027ce7"},"_deposit":{"created_by":1,"id":"32448","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"32448"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00032448","sets":["1887:1890","1896:1898:1899:1910"]},"author_link":["409171","409175","409176","409174","409173","409172"],"item_9_alternative_title_2":{"attribute_name":"その他のタイトル（英）","attribute_value_mlt":[{"subitem_alternative_title":"An Improved Retarding Potential Trap Method for Accurate Ion Temperature Measurement on Board : Improved R.P.T. Method for Space Sounding"}]},"item_9_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1978-12","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4_B","bibliographicPageEnd":"1214","bibliographicPageStart":"1203","bibliographicVolumeNumber":"14","bibliographic_titles":[{"bibliographic_title":"東京大学宇宙航空研究所報告"}]}]},"item_9_description_16":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"低密度プラズマにおいて,直流プローブによるプローブ特性を得る際に電極汚れが原因となる特性の歪がしばしば問題となる.この解決法としてすでにラングミュアプローブ法では電圧の高速掃引とガラス封じによるプローブの清浄保持がなされている.著者らは,高速掃引法を正イオン温度測定用イオントラップに適用し,その使用範囲を実験的に確めた.比較的微少な信号電流と電極のストレー容量のためにおきるレスポンスの遅れを,電子回路的に中和することで解決した.また,このプローブをロケットなど飛翔体に搭載してプラズマとの相対速度を逆に利用してイオン成分ごとの測定を行う.いわゆる遅延ポテンシャルトラップ(Retarding Potential Analyzer)として使用する際の本測定法の高い分解能を持つ利点について考察する.","subitem_description_type":"Abstract"}]},"item_9_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"The contamination effect to the d.c. probe in the plasma diagnostics is quite serious in the low density plasma. It causes the distortion or hysterisis curves on the probe characteristics. In order to escape it, for the Langmuir probe measurements, methods of high speed sweeping of probe voltage and using the cleaned probe are reported. In this paper, we dealed with the results of experimental examinations of the possibilities and the limitation of the application of above sweeping to the ion temperature measurement. The essential difficulties of the ion parament measurements to the d.c. probe of the electrons that very small signal currents and the strong capactance of the electrodes makes the large time constant, is solved by the use of the neutralization circuits. By this neutralization, high speed voltage sweeping can be possible, and high time resolution of the parameters can be obtained. Using this merits, when the probe is boarded on the space craft, this high space resolution of this probe has additive merits about the possibilities of the aspect measurements of plasma flow and the probe. It is concluded that the high scan rate ion trap is useful of the space craft to the erronious probing by the use of uncleaned probe.","subitem_description_type":"Other"}]},"item_9_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: SA0125701000","subitem_description_type":"Other"}]},"item_9_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"東京大学宇宙航空研究所"}]},"item_9_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0563-8100","subitem_source_identifier_type":"ISSN"}]},"item_9_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00161914","subitem_source_identifier_type":"NCID"}]},"item_9_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"大阪市大工学部"},{"subitem_text_value":"大阪市大工学部"},{"subitem_text_value":"大阪市大工学部"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"南, 繁行"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"堤, 四郎"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"竹屋, 芳夫"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"MINAMI, Shigeyuki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"TUTUMI, Shiro","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"TAKEYA, Yoshio","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-24"}],"displaytype":"detail","filename":"SA0125701.pdf","filesize":[{"value":"1.5 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"SA0125701.pdf","url":"https://jaxa.repo.nii.ac.jp/record/32448/files/SA0125701.pdf"},"version_id":"43ebfae8-37a2-41c6-987c-d288033ae711"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"<論文>電極汚れの効果を低減させた正イオン温度測定器の開発","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"<論文>電極汚れの効果を低減させた正イオン温度測定器の開発"}]},"item_type_id":"9","owner":"1","path":["1890","1910"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"32448","relation_version_is_last":true,"title":["<論文>電極汚れの効果を低減させた正イオン温度測定器の開発"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T00:32:07.064695+00:00"}