{"created":"2023-06-20T15:03:33.107068+00:00","id":32769,"links":{},"metadata":{"_buckets":{"deposit":"a965828f-8df2-42d4-82a2-9ee1b233aced"},"_deposit":{"created_by":1,"id":"32769","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"32769"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00032769","sets":["1887:1890","1896:1898:1899:1912"]},"author_link":["411584","411583","411586","411585","411582","411587"],"item_9_alternative_title_2":{"attribute_name":"その他のタイトル（英）","attribute_value_mlt":[{"subitem_alternative_title":"A graphical method to obtain the ion temperature from retarding potential analyzer characteristics"}]},"item_9_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1982-03","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"35","bibliographicPageStart":"25","bibliographicVolumeNumber":"2","bibliographic_titles":[{"bibliographic_title":"宇宙科学研究所報告. 特集: 宇宙観測研究報告"}]}]},"item_9_description_16":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"逆電位アナライザ(RPA)特性から図的解析法によってイオン温度を導出する方法についてのべる。RPA特性から通常は最適フィット法により電子計算機を用いてイオン温度が導出される。しかしその実行には長時間のCPU使用が必要である他, もし特性上にノイズ等によるひずみが存在しても, これはそのまま計算処理される欠点をもっている。本論文ではRPA特性においてイオン温度は, 飛翔体速度, アタックアングル, イオン質量によって決定されることを利用した新しい図的解析法についてのべる。またこの方法を飛翔体上で電子回路的に行なうことにより, イオン温度が実時間で測定できることを示す。","subitem_description_type":"Abstract"}]},"item_9_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"In this paper an improved data analysis method to deduce the ion temperature from a voltage to current characteristic of the retarding potential analyzer is dealt with. Usually optimum fitting procedures using a digital computer have been used in order to obtain the ion temperature T_i. But these methods need much time to search the parameters. The graphical method is developed to obtain the T_i quickly. This method is suitable not only for the processing of a large quantity of data but also for the inflight data analysis aboard the sounding rocket. In this paper the principle of this method and its application are shown.","subitem_description_type":"Other"}]},"item_9_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: SA0166520000","subitem_description_type":"Other"}]},"item_9_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙科学研究所"}]},"item_9_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Institute of Space and Astronautical Science"}]},"item_9_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0285-9920","subitem_source_identifier_type":"ISSN"}]},"item_9_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00354485","subitem_source_identifier_type":"NCID"}]},"item_9_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"大阪市立大学工学部"},{"subitem_text_value":"大阪市立大学工学部"},{"subitem_text_value":"大阪市立大学工学部"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"南, 繁行"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"堤, 四郎"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"竹屋, 芳夫"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"MINAMI, Shigeyuki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"TSUTSUMI, Shirou","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"TAKEYA, Yoshio","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-24"}],"displaytype":"detail","filename":"SA0166520.pdf","filesize":[{"value":"590.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"SA0166520.pdf","url":"https://jaxa.repo.nii.ac.jp/record/32769/files/SA0166520.pdf"},"version_id":"f97947e7-cac7-4261-bf5a-2f67900c49e6"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"逆電位アナライザ","subitem_subject_scheme":"Other"},{"subitem_subject":"イオン温度","subitem_subject_scheme":"Other"},{"subitem_subject":"データ解析法","subitem_subject_scheme":"Other"},{"subitem_subject":"Retarding potential analyzer","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Ion temperature","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Data analysis method","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"逆電位アナライザ特性の図的処理によるイオン温度の解析法とその応用","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"逆電位アナライザ特性の図的処理によるイオン温度の解析法とその応用"}]},"item_type_id":"9","owner":"1","path":["1890","1912"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"32769","relation_version_is_last":true,"title":["逆電位アナライザ特性の図的処理によるイオン温度の解析法とその応用"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T00:24:40.960305+00:00"}