{"created":"2023-06-20T15:03:33.172679+00:00","id":32770,"links":{},"metadata":{"_buckets":{"deposit":"8e3bc366-ab3b-4073-906a-daae71d0ad78"},"_deposit":{"created_by":1,"id":"32770","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"32770"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00032770","sets":["1887:1890","1896:1898:1899:1912"]},"author_link":["411592","411590","411591","411593","411589","411588"],"item_9_alternative_title_2":{"attribute_name":"その他のタイトル（英）","attribute_value_mlt":[{"subitem_alternative_title":"An optimum fitting procedure for ion temperature determination from retarding potential analyzer aboard sounding rocket"}]},"item_9_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1982-03","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"49","bibliographicPageStart":"37","bibliographicVolumeNumber":"2","bibliographic_titles":[{"bibliographic_title":"宇宙科学研究所報告. 特集: 宇宙観測研究報告"}]}]},"item_9_description_16":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"超高層プラズマ中のイオン温度の観測に用いる逆電位アナライザ(RPA)のデータ処理法について取扱っている。RPA特性は数種のパラメータによって決定され, イオン温度だけを単独で導出する方法はない。通常その解析法としては電子計算機を用いた最適フイットが用いられる。本論文でのべる解析法は, 特性の傾きに重点をおいた誤差評価関数を用いている点に特徴がある。またRPAをロケット観測に用いた場合の解析手順を示した。","subitem_description_type":"Abstract"}]},"item_9_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"In this paper an improved data analysis method to deduce the ion temperature T_i from retarding potential analyzer (RPA) is dealt with. A voltage to current curve of RPA characteristic is decided by several parameters. There is no way to obtain the ion temperature T_i independently. Usually the optimum fitting method has been performed by using a computer. We advocate the usefulness of the improved error evaluation function which weights the gradient of RPA curve. From the result of actual use the merits of this method are ascertained.","subitem_description_type":"Other"}]},"item_9_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: SA0166521000","subitem_description_type":"Other"}]},"item_9_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙科学研究所"}]},"item_9_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Institute of Space and Astronautical Science"}]},"item_9_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0285-9920","subitem_source_identifier_type":"ISSN"}]},"item_9_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00354485","subitem_source_identifier_type":"NCID"}]},"item_9_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"大阪市立大学工学部"},{"subitem_text_value":"大阪市立大学工学部"},{"subitem_text_value":"大阪市立大学工学部"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"南, 繁行"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"堤, 四郎"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"竹屋, 芳夫"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"MINAMI, Shigeyuki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"TSUTSUMI, Shirou","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"TAKEYA, Yoshio","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-24"}],"displaytype":"detail","filename":"SA0166521.pdf","filesize":[{"value":"766.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"SA0166521.pdf","url":"https://jaxa.repo.nii.ac.jp/record/32770/files/SA0166521.pdf"},"version_id":"cc98b696-6d2c-4401-a5f4-03a040fdf9fe"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"逆電位アナライザ","subitem_subject_scheme":"Other"},{"subitem_subject":"イオン温度","subitem_subject_scheme":"Other"},{"subitem_subject":"データ解析法","subitem_subject_scheme":"Other"},{"subitem_subject":"Retarding potential analyzer","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Ion temperature","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Data analysis method","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"多変数最適化による逆電位アナライザ特性のデータ処理法について","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"多変数最適化による逆電位アナライザ特性のデータ処理法について"}]},"item_type_id":"9","owner":"1","path":["1890","1912"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"32770","relation_version_is_last":true,"title":["多変数最適化による逆電位アナライザ特性のデータ処理法について"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T00:24:39.183604+00:00"}