{"created":"2023-06-20T15:05:11.975704+00:00","id":34467,"links":{},"metadata":{"_buckets":{"deposit":"1522cb6c-e0ac-47bb-badd-347ec1e3374c"},"_deposit":{"created_by":1,"id":"34467","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"34467"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00034467","sets":["1887:1890","1896:1898:1899:1992"]},"author_link":["419652"],"item_9_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1972-12","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"15","bibliographicPageEnd":"376","bibliographicPageStart":"369","bibliographicVolumeNumber":"37","bibliographic_titles":[{},{"bibliographic_title":"ISAS report/Institute of Space and Aeronautical Science,University of Tokyo","bibliographic_titleLang":"en"}]}]},"item_9_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"A new kind of X-ray polarimeter, which was successfully operated below 2KeV X-ray, is described. The angular distribution of secondary fluorescent X-rays emitted in the process of photoelectric effect is expected to exhibit an asymmetry correlated with the polarization vector of the initial X-ray. This asymmetrical behavior is utilized for polarization measurement.","subitem_description_type":"Other"}]},"item_9_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: SA2400889000","subitem_description_type":"Other"}]},"item_9_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"東京大学宇宙航空研究所"}]},"item_9_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Institute of Space and Aeronautical Science,University of Tokyo"}]},"item_9_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0372-1418","subitem_source_identifier_type":"ISSN"}]},"item_9_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00675986","subitem_source_identifier_type":"NCID"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"KIFUNE, Tadashi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-24"}],"displaytype":"detail","filename":"SA2400889.pdf","filesize":[{"value":"447.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"SA2400889.pdf","url":"https://jaxa.repo.nii.ac.jp/record/34467/files/SA2400889.pdf"},"version_id":"f048ae0d-e3ba-4fca-958b-2779bf654747"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Development of X-ray Polarimeter by Detecting Secondary Fluorescent X-rays","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Development of X-ray Polarimeter by Detecting Secondary Fluorescent X-rays","subitem_title_language":"en"}]},"item_type_id":"9","owner":"1","path":["1890","1992"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"34467","relation_version_is_last":true,"title":["Development of X-ray Polarimeter by Detecting Secondary Fluorescent X-rays"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-20T23:41:31.118943+00:00"}