@inproceedings{oai:jaxa.repo.nii.ac.jp:00003671,
 author = {Nguyen, Duc Minh and Khan, Arifur Rahman and 豊田, 和弘 and 趙, 孟佑 and Nguyen, Duc Minh and Khan, Arifur Rahman and Toyoda, Kazuhiro and Cho, Mengu},
 book = {宇宙航空研究開発機構特別資料: 第12回宇宙環境シンポジウム講演論文集, JAXA Special Publication: Proceedings of the 12th Spacecraft Environment Symposium},
 month = {Mar},
 note = {第12回 宇宙環境シンポジウム（2015年11月16日-18日. 北九州国際会議場　国際会議室）, 北九州市, 福岡県, The 12th Spacecraft Environment Symposium (November 16-18, 2015. International Conference Room, Kitakyushu International Conference Center), Kitakyushu, Fukuoka, Japan, Coverglass (CMG100AR) is widely used to protect the solar cell from harsh space environment. Due to surface charging, it acts as a platform where electrostatic discharge (ESD) can occur. In order to know the ESD threshold, coverglass is exposed to electron beam, measured the temporal surface potential rise until the discharge. ESD current waveform and discharge images are also recorded. ESD threshold voltage is statistically measured by Weibull distribution., 形態: カラー図版あり, Physical characteristics: Original contains color illustrations, 資料番号: AA1630004016, レポート番号: JAXA-SP-15-012},
 pages = {219--223},
 publisher = {宇宙航空研究開発機構(JAXA), Japan Aerospace Exploration Agency (JAXA)},
 title = {Measurement of ESD threshold voltage of coverglass (CMG100AR)},
 volume = {JAXA-SP-15-012},
 year = {2016}
}