{"created":"2023-06-20T15:08:41.006066+00:00","id":38175,"links":{},"metadata":{"_buckets":{"deposit":"7dfe8700-4e3f-43f9-b087-c7ea8f554ff5"},"_deposit":{"created_by":1,"id":"38175","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"38175"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00038175","sets":["1887:1891"]},"author_link":["432010","432011","432016","432017","432012","432014","432015","432013"],"item_5_alternative_title_2":{"attribute_name":"その他のタイトル（英）","attribute_value_mlt":[{"subitem_alternative_title":"X-ray polarimeter for a NeXT telescope: Scatter type or photoelectron tracking type?"}]},"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2003-07","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"140","bibliographicPageStart":"137","bibliographic_titles":[{"bibliographic_title":"平成14年度宇宙放射線シンポジウム:次期X線天文衛星NeXTは何を目指すか"},{"bibliographic_title":"Cosmic Radiation Symposium 2002: New Science to be Explored by the X-ray Astronomy Mission NeXT","bibliographic_titleLang":"en"}]}]},"item_5_description_16":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"NeXT望遠鏡の焦点面に硬X線偏光検出器を設置し偏光観測を行う可能性を検討する。硬X線領域での偏光検出器のタイプとしては散乱型と光電子追跡型があるが、一般に散乱型偏光計の方が高い偏光検出能力(Mη(sup 1/2))を得ることができる。一方、光電子追跡型はイメージング性能をあわせもつという利点がある。両者の得失をX線点源および広がったX線源の偏光観測という観点から議論する。","subitem_description_type":"Abstract"}]},"item_5_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0045914023","subitem_description_type":"Other"}]},"item_5_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙科学研究所"}]},"item_5_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"The Institute of Space and Astronautical Science (ISAS)"}]},"item_5_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"大阪大学"},{"subitem_text_value":"大阪大学"},{"subitem_text_value":"大阪大学"},{"subitem_text_value":"大阪大学"}]},"item_5_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Osaka University"},{"subitem_text_language":"en","subitem_text_value":"Osaka University"},{"subitem_text_language":"en","subitem_text_value":"Osaka University"},{"subitem_text_language":"en","subitem_text_value":"Osaka University"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"林田, 清"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"中嶋, 雄介"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"川崎, 寿久"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"白庄司, 貴之"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hayashida, Kiyoshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nakashima, Yusuke","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kawasaki, Kazuhisa","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shiroshoji, Takayuki","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"散乱型偏光計","subitem_subject_scheme":"Other"},{"subitem_subject":"X線検出器","subitem_subject_scheme":"Other"},{"subitem_subject":"MDP","subitem_subject_scheme":"Other"},{"subitem_subject":"Compton散乱","subitem_subject_scheme":"Other"},{"subitem_subject":"焦点面","subitem_subject_scheme":"Other"},{"subitem_subject":"検出効率","subitem_subject_scheme":"Other"},{"subitem_subject":"光電子追跡","subitem_subject_scheme":"Other"},{"subitem_subject":"モンテカルロシミュレーション","subitem_subject_scheme":"Other"},{"subitem_subject":"NeXT衛星","subitem_subject_scheme":"Other"},{"subitem_subject":"研究開発","subitem_subject_scheme":"Other"},{"subitem_subject":"CdTe検出器","subitem_subject_scheme":"Other"},{"subitem_subject":"スーパーミラー","subitem_subject_scheme":"Other"},{"subitem_subject":"scattering-type polarimeter","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"X-ray detector","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"MDP","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Compton scattering","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"focal plane","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"detection efficiency","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"photoelectron tracking","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Monte Carlo simulation","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"NeXT satellite","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"research and development","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"CdTe detector","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"supermirror","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"NeXT望遠鏡用X線偏光計:散乱型か光電子追跡型か?","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"NeXT望遠鏡用X線偏光計:散乱型か光電子追跡型か?"}]},"item_type_id":"5","owner":"1","path":["1891"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"38175","relation_version_is_last":true,"title":["NeXT望遠鏡用X線偏光計:散乱型か光電子追跡型か?"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-20T22:44:35.562842+00:00"}