@inproceedings{oai:jaxa.repo.nii.ac.jp:00038761,
 author = {山田, 理子 and 久保山, 智司 and Yamada, Noriko and Kuboyama, Satoshi},
 book = {第59回宇宙科学技術連合講演会講演集, Proceedings of 59th Space Sciences and Technology Conference},
 month = {Oct},
 note = {第59回宇宙科学技術連合講演会（2015年10月7日-9日. かごしま県民交流センター), 鹿児島市, 鹿児島県, EDEE is purposed to acquire the data of the important electronic parts for JEM according to the single event phenomenon due to the charged particles. The evaluated electronic parts are elected according to the important one for JEM system, many used ones, and the one possible for the single event phenomenon and are composed of MPU, 1MSRAM and PowerMOSFET., 形態: カラー図版あり, Physical characteristics: Original contains color illustrations, 資料番号: AC1600017000, レポート番号: JSASS-2015-4389},
 publisher = {日本航空宇宙学会(JSASS), The Japan Society for Aeronautical and Space Sciences (JSASS)},
 title = {JEM曝露部搭載宇宙環境計測ミッション装置(SEDA-AP)/電子部品評価装置(EDEE)},
 year = {2015}
}