{"created":"2023-06-20T15:09:29.939873+00:00","id":39059,"links":{},"metadata":{"_buckets":{"deposit":"2aafcd12-2c18-46d4-a26e-22a2d72ddaed"},"_deposit":{"created_by":1,"id":"39059","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"39059"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00039059","sets":["1887:1891"]},"author_link":["438933","438940","438935","438937","438939","438941","438942","438932","438930","438931","438934","438943","438938","438936"],"item_5_alternative_title_2":{"attribute_name":"その他のタイトル（英）","attribute_value_mlt":[{"subitem_alternative_title":"The LSI Process Diagnosis Technology by Hi Reliability system"}]},"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"60","bibliographicPageStart":"55","bibliographic_titles":[{}]}]},"item_5_description_14":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第34回日科技連信頼性・保全性シンポジウム(2004年7月)","subitem_description_type":"Other"}]},"item_5_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: ARDS04218000","subitem_description_type":"Other"}]},"item_5_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"日本科学技術連盟"}]},"item_5_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"沖エンジニアリング"},{"subitem_text_value":"沖エンジニアリング"},{"subitem_text_value":"沖エンジニアリング"},{"subitem_text_value":"沖エンジニアリング"},{"subitem_text_value":"宇宙航空研究開発機構(JAXA)"},{"subitem_text_value":"宇宙航空研究開発機構(JAXA)"},{"subitem_text_value":"宇宙航空研究開発機構(JAXA)"}]},"item_5_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Oki Engineering"},{"subitem_text_language":"en","subitem_text_value":"Oki Engineering"},{"subitem_text_language":"en","subitem_text_value":"Oki Engineering"},{"subitem_text_language":"en","subitem_text_value":"Oki Engineering"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency(JAXA)"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency(JAXA)"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency(JAXA)"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"矢部, 一博"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"田中, 大起"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"野田, 克史"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"菅沼, 貞雄"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"岡, 克己"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"久保山, 智司"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"松田, 純夫"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yabe, Kazuhiro","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tanaka, Daiki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Noda, Katsufumi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Suganuma, Sadao","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Oka, Katsumi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kuboyama, Satoshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Matsuda, Sumio","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"高信頼性システムのためのLSIプロセス診断による評価","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"高信頼性システムのためのLSIプロセス診断による評価"}]},"item_type_id":"5","owner":"1","path":["1891"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"39059","relation_version_is_last":true,"title":["高信頼性システムのためのLSIプロセス診断による評価"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-20T22:31:51.745642+00:00"}