{"created":"2023-06-20T15:09:33.267995+00:00","id":39130,"links":{},"metadata":{"_buckets":{"deposit":"60a2fd2b-f934-44fd-ba96-7a1631887a2a"},"_deposit":{"created_by":1,"id":"39130","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"39130"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00039130","sets":["1887:1891"]},"author_link":["439491","439490"],"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"101","bibliographicPageStart":"93","bibliographic_titles":[{},{"bibliographic_title":"Proceedings of the 2005 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI  Systems (DFT’05)","bibliographic_titleLang":"en"}]}]},"item_5_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: ARDS05065000","subitem_description_type":"Other"}]},"item_5_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"The Institute of Electrical and Electronics Engineers, Inc.(IEEE) Computer Society"}]},"item_5_relation_25":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"info:doi/10.1109/DFTVS.2005.34"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://dx.doi.org/10.1109/DFTVS.2005.34","subitem_relation_type_select":"DOI"}}]},"item_5_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"宇宙航空研究開発機構総合技術研究本部(JAXA)"}]},"item_5_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Institute of Space Technology and Aeronautics, Japan Aerospace Exploration Agency(JAXA)"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"金子, 晴彦"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kaneko, Haruhiko","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Error Control Coding for Semiconductor Memory Systems in the Space Radiation Environment","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Error Control Coding for Semiconductor Memory Systems in the Space Radiation Environment","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["1891"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"39130","relation_version_is_last":true,"title":["Error Control Coding for Semiconductor Memory Systems in the Space Radiation Environment"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-20T22:30:55.143607+00:00"}