{"created":"2023-06-20T14:37:32.348387+00:00","id":3953,"links":{},"metadata":{"_buckets":{"deposit":"f45338c8-392c-475f-b74a-671bdd38247a"},"_deposit":{"created_by":1,"id":"3953","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"3953"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00003953","sets":["1398:1485:1491","1543:1811:1817","1887:1891","9:789:868:872"]},"author_link":["16822","16823","16821","16824"],"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2014-03-31","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"60","bibliographicPageStart":"57","bibliographicVolumeNumber":"JAXA-SP-13-016","bibliographic_titles":[{"bibliographic_title":"宇宙航空研究開発機構特別資料: 第10回宇宙環境シンポジウム講演論文集"},{"bibliographic_title":"JAXA Special Publication: Proceedings of the 10th Spacecraft Environment Symposium","bibliographic_titleLang":"en"}]}]},"item_5_description_14":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第10回宇宙環境シンポジウム (2013年12月2日-3日. 科学技術館), 東京","subitem_description_type":"Other"}]},"item_5_description_15":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）（英）","attribute_value_mlt":[{"subitem_description":"10th Spacecraft Environment Symposium (December 2-3, 2013, Science Museum), Tokyo Japan","subitem_description_type":"Other"}]},"item_5_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"Spacecraft payloads are multifunctional and provide a high degree of technicality. Because of these, the power consumption of spacecraft increases. Therefore, the bus voltage must be raised to mitigate the loss during transmission just as it is done for infrastructures on the Earth. Unlike on Earth, 100V is already considered as a high voltage in space, which can lead to arcing because of the interaction of the charged spacecraft with the ambient plasma. The arcing risk is particularly high on solar array. A way of solving problems related to the high voltage technology will be the key for the next generation space technologies such as larger space stations, space hotels, and so on. The authors performed two demonstration experiments in near earth orbit (low earth orbit and polar earth orbit) for testing solutions to the aforementioned problem. First, the data from HORYU-2, nano-satellite developed by Kyushu Institute of Technology, were analyzed. HORYU-2 mission consists in generating 300V without causing arcing, and contributing to the practical development of the next generation space systems. Second, a degradation test by arcs was performed on solar cells onboard the International Space Station by using PASCAL (Primary Arc effect Solar Cell At Leo), which was included MISSE-8 (Material on the International space station Experiment-8). In this paper, the high voltage and the arcing mitigation feasibility from data analysis results in near earth orbit are presented.","subitem_description_type":"Other"}]},"item_5_description_18":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"形態: カラー図版あり","subitem_description_type":"Other"}]},"item_5_description_19":{"attribute_name":"内容記述（英）","attribute_value_mlt":[{"subitem_description":"Physical characteristics: Original contains color illustrations","subitem_description_type":"Other"}]},"item_5_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0062301008","subitem_description_type":"Other"}]},"item_5_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: JAXA-SP-13-016","subitem_description_type":"Other"}]},"item_5_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙航空研究開発機構(JAXA)"}]},"item_5_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_5_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1349-113X","subitem_source_identifier_type":"ISSN"}]},"item_5_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11984031","subitem_source_identifier_type":"NCID"}]},"item_5_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東京都市大学"},{"subitem_text_value":"東京都市大学"}]},"item_5_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Tokyo City University"},{"subitem_text_language":"en","subitem_text_value":"Tokyo City University"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"後藤, 浩友樹"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"渡邉, 力夫"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Goto, -","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Watanabe, Rikio","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-16"}],"displaytype":"detail","filename":"62301008.pdf","filesize":[{"value":"839.8 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"62301008.pdf","url":"https://jaxa.repo.nii.ac.jp/record/3953/files/62301008.pdf"},"version_id":"3d168518-4cff-400a-a1bb-3685aa8558da"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"電子線が繰り返し照射された誘電体材料の体積抵抗率に対する試料温度の影響に関する研究","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"電子線が繰り返し照射された誘電体材料の体積抵抗率に対する試料温度の影響に関する研究"}]},"item_type_id":"5","owner":"1","path":["872","1491","1817","1891"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"3953","relation_version_is_last":true,"title":["電子線が繰り返し照射された誘電体材料の体積抵抗率に対する試料温度の影響に関する研究"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T08:51:24.660927+00:00"}