{"created":"2023-06-20T15:11:05.714311+00:00","id":40674,"links":{},"metadata":{"_buckets":{"deposit":"e6378095-d01a-4d09-9052-d4fc19b62388"},"_deposit":{"created_by":1,"id":"40674","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"40674"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00040674","sets":["1887:1893","1896:1898:1933:1934"]},"author_link":["500977","500981","500976","500978","500980","500979"],"item_3_alternative_title_1":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"半導体溶融への残留重力およびgジッタの影響に関する数値解析"}]},"item_3_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1999-09-30","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"34","bibliographicPageStart":"27","bibliographic_titles":[{"bibliographic_title":"宇宙開発事業団技術報告"},{"bibliographic_title":"NASDA Technical Memorandum","bibliographic_titleLang":"en"}]}]},"item_3_description_16":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"半導体溶液中で重力変動によって発生する浮力対流に関し、数値計算による研究を行った。温度差と濃度差に基づく浮力を検討対象とした。残留重力は0gあるいは10(exp -4)gとし、重力変動の振幅は10(exp -4)gあるいは10(exp -3)gとした。重力変動の周波数は10(exp -3)Hzから10Hzとした。重力変動の振幅および周波数が速度、温度、および濃度場に与える影響について検討し、さらに分岐を表す図を作成した。この解析の結果、下記のことがわかった。(1)速度、温度、および濃度の変動は、重力変動の周波数が高いときには小さいが、重力変動の周波数が0.01Hz以下になると大きくなる。(2)重力変動の周波数が小さくなるにつれて、速度、温度、および濃度の変動は正弦曲線から逸脱し、分岐が生じる。(3)濃度変動の振幅は、重力変動が存在しない場合よりは重力変動が存在する場合の方が小さくなる。","subitem_description_type":"Abstract"}]},"item_3_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"Buoyancy convection induced in a semiconductor solution by gravity fluctuations is studied numerically. Buoyancy forces based on the temperature and concentration differences are taken into account. The residual gravity is 0g and 10(exp -4)g, and the amplitude of gravity fluctuation is 10(exp -4)g and 10(exp -3)g. The frequency of gravity fluctuation is changed from 10(exp -3) Hz to 10 Hz. The effects of the amplitude and frequency of gravity fluctuation on the velocity, the temperature and concentration fields were investigated and the bifurcation diagrams are produced. Through this analysis, the following results were obtained: (1) the amplitudes of velocity, temperature and concentration fluctuations are small when the frequency of the gravity fluctuation is high but they become large when the frequency of gravity fluctuation is lower than 0.01 Hz; (2) the fluctuations of velocity, temperature and concentration deviate from sinusoidal curves and bifurcation occurs as the frequency of gravity fluctuation decreases; and (3) the amplitude of concentration fluctuations becomes smaller under residual gravity than in the absence of residual gravity.","subitem_description_type":"Other"}]},"item_3_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0002208003","subitem_description_type":"Other"}]},"item_3_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: NASDA-TMR-990006E","subitem_description_type":"Other"}]},"item_3_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙開発事業団"}]},"item_3_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"National Space Development Agency of Japan (NASDA)"}]},"item_3_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1345-7888","subitem_source_identifier_type":"ISSN"}]},"item_3_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00364784","subitem_source_identifier_type":"NCID"}]},"item_3_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東洋大学"},{"subitem_text_value":"東洋大学"},{"subitem_text_value":"宇宙開発事業団"}]},"item_3_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Toyo University"},{"subitem_text_language":"en","subitem_text_value":"Toyo University"},{"subitem_text_language":"en","subitem_text_value":"National Space Development Agency of Japan"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"前川, 透"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"平岡, 良章"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"松本, 聡"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Maekawa, Toru","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hiraoka, Yoshiaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Matsumoto, Satoshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-02-10"}],"displaytype":"detail","filename":"02208003.pdf","filesize":[{"value":"477.7 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"02208003.pdf","url":"https://jaxa.repo.nii.ac.jp/record/40674/files/02208003.pdf"},"version_id":"0b91ae76-0656-4a12-b455-8e992547c2d4"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"残留加速度","subitem_subject_scheme":"Other"},{"subitem_subject":"g-ジッタ","subitem_subject_scheme":"Other"},{"subitem_subject":"半導体溶融液","subitem_subject_scheme":"Other"},{"subitem_subject":"浮力対流","subitem_subject_scheme":"Other"},{"subitem_subject":"速度変動","subitem_subject_scheme":"Other"},{"subitem_subject":"温度変動","subitem_subject_scheme":"Other"},{"subitem_subject":"濃度変動","subitem_subject_scheme":"Other"},{"subitem_subject":"分岐図","subitem_subject_scheme":"Other"},{"subitem_subject":"重力変動","subitem_subject_scheme":"Other"},{"subitem_subject":"残留重力","subitem_subject_scheme":"Other"},{"subitem_subject":"residual acceleration","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"g jitter","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"semiconductor melt","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"buoyancy convection","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"velocity fluctuation","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"temperature fluctuation","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"concentration fluctuation","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"bifurcation diagram","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"gravity fluctuation","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"residual gravity","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"technical report","resourceuri":"http://purl.org/coar/resource_type/c_18gh"}]},"item_title":"Analyses of effects of residual accelerations and g-jitter on semiconductor melts","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Analyses of effects of residual accelerations and g-jitter on semiconductor melts","subitem_title_language":"en"}]},"item_type_id":"3","owner":"1","path":["1893","1934"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"40674","relation_version_is_last":true,"title":["Analyses of effects of residual accelerations and g-jitter on semiconductor melts"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-20T20:28:11.018241+00:00"}