{"created":"2023-06-20T15:11:44.934708+00:00","id":41471,"links":{},"metadata":{"_buckets":{"deposit":"2b09461c-ee5e-4432-bfe5-cd8ff89a1be7"},"_deposit":{"created_by":1,"id":"41471","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"41471"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00041471","sets":["1887:1893","1896:1898:1913:1916"]},"author_link":["452554","452559","452551","452553","452555","452557","452558","452550","452556","452552"],"item_3_alternative_title_2":{"attribute_name":"その他のタイトル（英）","attribute_value_mlt":[{"subitem_alternative_title":"Measurement of high temperature emissivity using the moving specimen method"}]},"item_3_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2000-11","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"5","bibliographicPageStart":"1","bibliographicVolumeNumber":"755","bibliographic_titles":[{"bibliographic_title":"航空宇宙技術研究所資料"},{"bibliographic_title":"Technical Memorandum of National Aerospace Laboratory","bibliographic_titleLang":"en"}]}]},"item_3_description_16":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"空気加熱などによって高温になる構造物の設計に不可欠な熱物性値の1つである放射率を、試料移動法によって測定する方法を確立した。計測値の補正法を明確にし、高中低の3領域の値を評価できることを示した。","subitem_description_type":"Abstract"}]},"item_3_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"In this paper a new technique was proposed for the measurement of high temperature emissivity. The method employed here is based on the moving specimen method, and the new technique was applied to graphite specimens in several states of surface roughness. It was observed that emissivity depends on the roughness of the surface and is influenced by the time constant of the emissivity sensor.","subitem_description_type":"Other"}]},"item_3_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0028647000","subitem_description_type":"Other"}]},"item_3_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: NAL TM-755","subitem_description_type":"Other"}]},"item_3_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"航空宇宙技術研究所"}]},"item_3_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"National Aerospace Laboratory (NAL)"}]},"item_3_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0452-2982","subitem_source_identifier_type":"ISSN"}]},"item_3_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00314334","subitem_source_identifier_type":"NCID"}]},"item_3_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"航空宇宙技術研究所"},{"subitem_text_value":"航空宇宙技術研究所"},{"subitem_text_value":"宇宙開発事業団"},{"subitem_text_value":"A.E.S"},{"subitem_text_value":"A.E.S"}]},"item_3_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"National Aerospace Laboratory"},{"subitem_text_language":"en","subitem_text_value":"National Aerospace Laboratory"},{"subitem_text_language":"en","subitem_text_value":"National Space Development Agency of Japan"},{"subitem_text_language":"en","subitem_text_value":"Advanced Engineering Services Co Ltd"},{"subitem_text_language":"en","subitem_text_value":"Advanced Engineering Services Co Ltd"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"佐野, 政明"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"石田, 清道"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"三保, 和之"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"濱村, 修"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"小林, 諭"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Sano, Masaaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ishida, Kiyomichi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Miho, Kazuyuki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hamamura, Osamu","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kobayashi, Satoshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-27"}],"displaytype":"detail","filename":"naltm0000755.pdf","filesize":[{"value":"659.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"naltm0000755.pdf","url":"https://jaxa.repo.nii.ac.jp/record/41471/files/naltm0000755.pdf"},"version_id":"87e36b8e-8d53-4410-8f4d-d47bae624151"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"高温放射率","subitem_subject_scheme":"Other"},{"subitem_subject":"放射率測定","subitem_subject_scheme":"Other"},{"subitem_subject":"試料移動法","subitem_subject_scheme":"Other"},{"subitem_subject":"黒鉛試料","subitem_subject_scheme":"Other"},{"subitem_subject":"表面粗さ","subitem_subject_scheme":"Other"},{"subitem_subject":"放射率センサ","subitem_subject_scheme":"Other"},{"subitem_subject":"時定数","subitem_subject_scheme":"Other"},{"subitem_subject":"high temperature emissivity","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"emissivity measurement","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"moving specimen method","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"graphite specimen","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"surface roughness","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"emissivity sensor","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"time constant","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"technical 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