{"created":"2023-06-20T15:12:44.429916+00:00","id":42612,"links":{},"metadata":{"_buckets":{"deposit":"5b949d2b-176a-493f-99b1-fd32ae6c7f6a"},"_deposit":{"created_by":1,"id":"42612","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"42612"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00042612","sets":["1887:1893","1896:1898:1933:1934"]},"author_link":["502251","502250","502253","502249","502248","502252"],"item_3_alternative_title_1":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"小角度X線散乱法による液体金属の低Q領域におけるS(Q)の測定"}]},"item_3_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2002-02-28","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"90","bibliographicPageStart":"85","bibliographic_titles":[{},{"bibliographic_title":"Modeling and Precise Experiments of Diffusion Phenomena in Melts Under Microgravity: Annual Report 2000","bibliographic_titleLang":"en"}]}]},"item_3_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"For the evaluation of effective interatomic potentials due to the inverse problem method coupled with the molecular dynamics simulation, the low wave number region of static structure factor is necessary with high accuracy. The small angle X-ray scattering with liquid slab sample is one of the methods to obtain it, though the intensity of small angle scattering is much smaller than that of usually measured angle. The sample holder of liquid slab sample between thin graphite crystals is developed for the laboratory base small angle X-ray scattering facilities which is 1 8 kW Mo rotation target. The obtained scattering data of liquid tin and germanium are reported.","subitem_description_type":"Other"}]},"item_3_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0033133007","subitem_description_type":"Other"}]},"item_3_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: NASDA-TMR-010019E","subitem_description_type":"Other"}]},"item_3_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙開発事業団"}]},"item_3_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"National Space Development Agency of Japan (NASDA)"}]},"item_3_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1345-7888","subitem_source_identifier_type":"ISSN"}]},"item_3_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"宇宙開発事業団 宇宙環境利用研究センター"},{"subitem_text_value":"宇宙開発事業団 宇宙環境利用研究システム"},{"subitem_text_value":"宇宙開発事業団 宇宙環境利用研究システム"}]},"item_3_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"National Space Development Agency of Japan Space Utilization Research Center"},{"subitem_text_language":"en","subitem_text_value":"National Space Development Agency of Japan Space Utilization Research Program"},{"subitem_text_language":"en","subitem_text_value":"National Space Development Agency of Japan Space Utilization Research Program"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"正木, 匡彦"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"宗尻, 修治"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"伊丹, 俊夫"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Masaki, Tadahiko","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Munejiri, Shuji","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Itami, Toshio","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-02-10"}],"displaytype":"detail","filename":"33133007.pdf","filesize":[{"value":"625.8 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"33133007.pdf","url":"https://jaxa.repo.nii.ac.jp/record/42612/files/33133007.pdf"},"version_id":"2589f6e7-7d90-4be4-9830-0773cd9eaf1b"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"静止構造因子","subitem_subject_scheme":"Other"},{"subitem_subject":"低波数","subitem_subject_scheme":"Other"},{"subitem_subject":"液体Sn","subitem_subject_scheme":"Other"},{"subitem_subject":"液体Ge","subitem_subject_scheme":"Other"},{"subitem_subject":"X線散乱","subitem_subject_scheme":"Other"},{"subitem_subject":"中性子散乱","subitem_subject_scheme":"Other"},{"subitem_subject":"吸収補正","subitem_subject_scheme":"Other"},{"subitem_subject":"位置有感プロポーショナルカウンター","subitem_subject_scheme":"Other"},{"subitem_subject":"研究開発","subitem_subject_scheme":"Other"},{"subitem_subject":"static structure factor","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"low wave number","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"liquid Sn","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"liquid Ge","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"X ray scattering","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"neutron scattering","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"absorption correction","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"position sensitive proportional counter","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"research and development","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"technical report","resourceuri":"http://purl.org/coar/resource_type/c_18gh"}]},"item_title":"Measurement of low Q region of S(Q) of liquid metals due to the small angle X-ray scattering method","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Measurement of low Q region of S(Q) of liquid metals due to the small angle X-ray scattering method","subitem_title_language":"en"}]},"item_type_id":"3","owner":"1","path":["1893","1934"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"42612","relation_version_is_last":true,"title":["Measurement of low Q region of S(Q) of liquid metals due to the small angle X-ray scattering method"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-20T20:25:17.026534+00:00"}