@inproceedings{oai:jaxa.repo.nii.ac.jp:00004299,
 author = {Maeda, Takahiro and Kakimi, Yukitaka and Akashi, Kenji and Oshima, Takeshi and Onoda, Shinobu and Maeda, Takahiro and Kakimi, Yukitaka and Akashi, Kenji and Oshima, Takeshi and Onoda, Shinobu},
 book = {宇宙航空研究開発機構特別資料, JAXA Special Publication},
 month = {Mar},
 note = {In small satellite development, general electronic (COTS) devices are needed to use due to some severe restrictions of resource for installed components. For this reason, it is important to keep reliability for using COTS devices in small satellite development. Therefore, in order to ensure reliability for small satellite, our company has evaluated COTS devices mainly for tolerance of single event at Japan Atomic Energy Agency (JAEA) Takasaki Advanced Radiation Research Institute from fiscal year 2008., 形態: カラー図版あり, Physical characteristics: Original contains color illustrations, 資料番号: AA0061889005, レポート番号: JAXA-SP-12-008E},
 pages = {28--29},
 publisher = {宇宙航空研究開発機構(JAXA), Japan Aerospace Exploration Agency (JAXA)},
 title = {Research of the radiation tolerance in space environment of general electronic devices},
 volume = {JAXA-SP-12-008E},
 year = {2013}
}