{"created":"2023-06-20T14:37:51.875754+00:00","id":4312,"links":{},"metadata":{"_buckets":{"deposit":"a25780de-8f56-46f9-9e96-432e075cd054"},"_deposit":{"created_by":1,"id":"4312","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"4312"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00004312","sets":["1887:1891","9:789:888:898"]},"author_link":["19063","19053","19065","19060","19046","19055","19056","19058","19062","19049","19052","19048","19054","19059","19047","19057","19061","19050","19064","19051"],"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-03-29","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"87","bibliographicPageStart":"84","bibliographicVolumeNumber":"JAXA-SP-12-008E","bibliographic_titles":[{"bibliographic_title":"宇宙航空研究開発機構特別資料"},{"bibliographic_title":"JAXA Special Publication","bibliographic_titleLang":"en"}]}]},"item_5_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"The 2-MeV electron radiation damage of Si(1-y)C(y) S/D n-type MOSFETs with different C concentrations is studied. Before irradiation, an enhancement of the electron mobility with C concentration of the S/D stressors is clearly observed. On the other hand, both the threshold voltage shift and the maximum electron mobility degradation are independent on the C concentration for all electron fluences. These results indicate that the strain induced electron mobility enhancement due to C concentration is retained after irradiation in the studied devices.","subitem_description_type":"Other"}]},"item_5_description_18":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"形態: カラー図版あり","subitem_description_type":"Other"}]},"item_5_description_19":{"attribute_name":"内容記述（英）","attribute_value_mlt":[{"subitem_description":"Physical characteristics: Original contains color illustrations","subitem_description_type":"Other"}]},"item_5_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0061889018","subitem_description_type":"Other"}]},"item_5_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: JAXA-SP-12-008E","subitem_description_type":"Other"}]},"item_5_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙航空研究開発機構(JAXA)"}]},"item_5_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_5_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1349-113X","subitem_source_identifier_type":"ISSN"}]},"item_5_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11984031","subitem_source_identifier_type":"NCID"}]},"item_5_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"宮崎大学 : 中央電子工業"},{"subitem_text_value":"熊本高等専門学校"},{"subitem_text_value":"熊本高等専門学校"},{"subitem_text_value":"熊本高等専門学校"},{"subitem_text_value":"熊本高等専門学校"},{"subitem_text_value":"熊本高等専門学校"},{"subitem_text_value":"Institut de Microelectronica de Barcelona (CNM -CSIC) Campus UAB"},{"subitem_text_value":"imec"},{"subitem_text_value":"imec : E.E. Dept."},{"subitem_text_value":"宮崎大学"}]},"item_5_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"University of Miyazaki : Chuo Denshi Kogyo Co. Ltd."},{"subitem_text_language":"en","subitem_text_value":"Kumamoto National College of Technology"},{"subitem_text_language":"en","subitem_text_value":"Kumamoto National College of Technology"},{"subitem_text_language":"en","subitem_text_value":"Kumamoto National College of Technology"},{"subitem_text_language":"en","subitem_text_value":"Kumamoto National College of Technology"},{"subitem_text_language":"en","subitem_text_value":"Kumamoto National College of Technology"},{"subitem_text_language":"en","subitem_text_value":"Institut de Microelectronica de Barcelona (CNM -CSIC) Campus UAB"},{"subitem_text_language":"en","subitem_text_value":"imec"},{"subitem_text_language":"en","subitem_text_value":"imec : E.E. Dept."},{"subitem_text_language":"en","subitem_text_value":"University of Miyazaki"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Nakashima, T."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Asai, Y."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hori, M."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yoneoka, M."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tsunoda, I."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takakura, T."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Gonzalez, M. 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