@inproceedings{oai:jaxa.repo.nii.ac.jp:00004313,
 author = {Virtanen, Ari},
 book = {宇宙航空研究開発機構特別資料, JAXA Special Publication},
 month = {Mar},
 note = {This talk gives an overview of methods to test component failures caused by space radiation. First, a short introduction to the reasons such tests are necessary, and recent developments in test methodologies are given. Then, radiation environment and error effects, most specifically total dose and single-event-effects, are introduced. A more detailed description is given of the physics of different radiation interactions in semiconductors and the requirements they set for test methods. Facilities used worldwide to study radiation effects in electronics are listed, from which two commonly used test facilities are introduced in more detail., 形態: カラー図版あり, Physical characteristics: Original contains color illustrations, 資料番号: AA0061889019, レポート番号: JAXA-SP-12-008E},
 pages = {90--95},
 publisher = {宇宙航空研究開発機構(JAXA), Japan Aerospace Exploration Agency (JAXA)},
 title = {Facilities and Radiation Test Methods},
 volume = {JAXA-SP-12-008E},
 year = {2013}
}