@inproceedings{oai:jaxa.repo.nii.ac.jp:00004321,
 author = {Shindo, H. and Maru, A. and Ebihara, T. and Makihara, A. and Kuboyama, S. and Tamura, T. and Shindo, H. and Maru, A. and Ebihara, T. and Makihara, A. and Kuboyama, S. and Tamura, T.},
 book = {宇宙航空研究開発機構特別資料, JAXA Special Publication},
 month = {Mar},
 note = {This paper describes the evaluation result of the SEE sensitivity of 90nm DICE based flip-flops. Considering our past experimental results, modified DICE circuits were designed in order to minimize the charge sharing effect. The pulsed-laser SEE testing methodology was effectively utilized to identify the location of SEE sensitive areas. The comparison with the heavy ion irradiation test result were also discussed., 形態: カラー図版あり, Physical characteristics: Original contains color illustrations, 資料番号: AA0061889027, レポート番号: JAXA-SP-12-008E},
 pages = {127--130},
 publisher = {宇宙航空研究開発機構(JAXA), Japan Aerospace Exploration Agency (JAXA)},
 title = {Investigation of the SEE sensitivity of 90nm DICE based Flip-Flops using pulsed laser testing methodology},
 volume = {JAXA-SP-12-008E},
 year = {2013}
}