{"created":"2023-06-20T14:37:52.445310+00:00","id":4321,"links":{},"metadata":{"_buckets":{"deposit":"db271d93-0ca5-4805-8179-8ed5dee643f9"},"_deposit":{"created_by":1,"id":"4321","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"4321"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00004321","sets":["1887:1891","9:789:888:898"]},"author_link":["19156","19155","19157","19154","19161","19158","19159","19163","19160","19164","19165","19162"],"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-03-29","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"130","bibliographicPageStart":"127","bibliographicVolumeNumber":"JAXA-SP-12-008E","bibliographic_titles":[{"bibliographic_title":"宇宙航空研究開発機構特別資料"},{"bibliographic_title":"JAXA Special Publication","bibliographic_titleLang":"en"}]}]},"item_5_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"This paper describes the evaluation result of the SEE sensitivity of 90nm DICE based flip-flops. Considering our past experimental results, modified DICE circuits were designed in order to minimize the charge sharing effect. The pulsed-laser SEE testing methodology was effectively utilized to identify the location of SEE sensitive areas. The comparison with the heavy ion irradiation test result were also discussed.","subitem_description_type":"Other"}]},"item_5_description_18":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"形態: カラー図版あり","subitem_description_type":"Other"}]},"item_5_description_19":{"attribute_name":"内容記述（英）","attribute_value_mlt":[{"subitem_description":"Physical characteristics: Original contains color illustrations","subitem_description_type":"Other"}]},"item_5_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0061889027","subitem_description_type":"Other"}]},"item_5_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: JAXA-SP-12-008E","subitem_description_type":"Other"}]},"item_5_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙航空研究開発機構(JAXA)"}]},"item_5_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_5_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1349-113X","subitem_source_identifier_type":"ISSN"}]},"item_5_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11984031","subitem_source_identifier_type":"NCID"}]},"item_5_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"宇宙航空研究開発機構(JAXA)"},{"subitem_text_value":"宇宙航空研究開発機構(JAXA)"},{"subitem_text_value":"宇宙航空研究開発機構(JAXA)"},{"subitem_text_value":"HIREC株式会社"},{"subitem_text_value":"宇宙航空研究開発機構(JAXA)"},{"subitem_text_value":"宇宙航空研究開発機構(JAXA)"}]},"item_5_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency (JAXA)"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency (JAXA)"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency (JAXA)"},{"subitem_text_language":"en","subitem_text_value":"High-Reliability Engineering & Components Corporation (HIREC)"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency (JAXA)"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Shindo, H."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Maru, A."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ebihara, T."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Makihara, A."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kuboyama, S."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tamura, T."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shindo, H.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Maru, A.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ebihara, T.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Makihara, A.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kuboyama, S.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tamura, T.","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-16"}],"displaytype":"detail","filename":"61889027.pdf","filesize":[{"value":"715.8 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"61889027.pdf","url":"https://jaxa.repo.nii.ac.jp/record/4321/files/61889027.pdf"},"version_id":"5f2a8816-c691-4358-b489-b1adfd8c15ab"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"90nm, DICE","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Single event transient","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Charge sharing","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Pulsed-laser testing","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Investigation of the SEE sensitivity of 90nm DICE based Flip-Flops using pulsed laser testing methodology","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Investigation of the SEE sensitivity of 90nm DICE based Flip-Flops using pulsed laser testing methodology","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["898","1891"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"4321","relation_version_is_last":true,"title":["Investigation of the SEE sensitivity of 90nm DICE based Flip-Flops using pulsed laser testing methodology"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T08:42:22.701691+00:00"}