{"created":"2023-06-20T14:37:52.769015+00:00","id":4326,"links":{},"metadata":{"_buckets":{"deposit":"0ce30b30-49ae-4ece-bd50-caec744c8b26"},"_deposit":{"created_by":1,"id":"4326","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"4326"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00004326","sets":["1887:1891","9:789:888:898"]},"author_link":["19214","19213","19223","19212","19219","19215","19225","19218","19221","19222","19220","19217","19216","19224"],"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-03-29","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"154","bibliographicPageStart":"148","bibliographicVolumeNumber":"JAXA-SP-12-008E","bibliographic_titles":[{"bibliographic_title":"宇宙航空研究開発機構特別資料"},{"bibliographic_title":"JAXA Special Publication","bibliographic_titleLang":"en"}]}]},"item_5_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"Abstract-As semiconductor device scaling is on-going far below 100nm design rule, terrestrial neutron-induced soft-error typically in CMOS devices is predicted to be worsen furthermore. Moreover, novel failure modes that may be more serious than those in memory soft-error are recently being reported. Therefore, necessity of implementing mitigation techniques is rapidly growing at the design phase, together with development of advanced detection and quantification techniques. The most advanced such techniques are reviewed and discussed.","subitem_description_type":"Other"}]},"item_5_description_18":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"形態: カラー図版あり","subitem_description_type":"Other"}]},"item_5_description_19":{"attribute_name":"内容記述（英）","attribute_value_mlt":[{"subitem_description":"Physical characteristics: Original contains color illustrations","subitem_description_type":"Other"}]},"item_5_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0061889032","subitem_description_type":"Other"}]},"item_5_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: JAXA-SP-12-008E","subitem_description_type":"Other"}]},"item_5_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙航空研究開発機構(JAXA)"}]},"item_5_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_5_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1349-113X","subitem_source_identifier_type":"ISSN"}]},"item_5_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11984031","subitem_source_identifier_type":"NCID"}]},"item_5_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"日立製作所横浜研究所"},{"subitem_text_value":"日立製作所横浜研究所"},{"subitem_text_value":"日立製作所横浜研究所"},{"subitem_text_value":"日立製作所横浜研究所"},{"subitem_text_value":"日立製作所横浜研究所"},{"subitem_text_value":"日立製作所通信ネットワーク事業部"},{"subitem_text_value":"日立製作所"}]},"item_5_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Yokohama Research Laboratory, Hitachi, Ltd."},{"subitem_text_language":"en","subitem_text_value":"Yokohama Research Laboratory, Hitachi, Ltd."},{"subitem_text_language":"en","subitem_text_value":"Yokohama Research Laboratory, Hitachi, Ltd."},{"subitem_text_language":"en","subitem_text_value":"Yokohama Research Laboratory, Hitachi, Ltd."},{"subitem_text_language":"en","subitem_text_value":"Yokohama Research Laboratory, Hitachi, Ltd."},{"subitem_text_language":"en","subitem_text_value":"Telecommunication & Network System Division, Hitachi, Ltd."},{"subitem_text_language":"en","subitem_text_value":"Corporate Quality Assurance Division, Hitachi, Ltd."}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Ibe, Eishi"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shimbo, Kenichi"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Toba, Tadanobu"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Taniguchi, Hitoshi"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Uezono, Takumi"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nishii, Koji"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Taniguchi, Yoshio"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ibe, Eishi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shimbo, Kenichi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Toba, Tadanobu","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Taniguchi, Hitoshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Uezono, Takumi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nishii, Koji","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Taniguchi, Yoshio","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-16"}],"displaytype":"detail","filename":"61889032.pdf","filesize":[{"value":"556.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"61889032.pdf","url":"https://jaxa.repo.nii.ac.jp/record/4326/files/61889032.pdf"},"version_id":"c4ceb202-88d9-4ae4-97bc-90f28f555aeb"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"terrestrial radiation","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"fault","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"soft-error","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"failure","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"network","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"stack layer","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"mitigation","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"DOUB","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"LABIR","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"TMR","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"MCBI","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"bipolar action","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"State-of-the-Art Study on Mitigation Techniques of Single Event Effects in Terrestrial Applications","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"State-of-the-Art Study on Mitigation Techniques of Single Event Effects in Terrestrial Applications","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["898","1891"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"4326","relation_version_is_last":true,"title":["State-of-the-Art Study on Mitigation Techniques of Single Event Effects in Terrestrial Applications"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T08:42:12.803265+00:00"}