@inproceedings{oai:jaxa.repo.nii.ac.jp:00004328,
 author = {Furuta, Jun and Kobayashi, Kazutoshi and Onodera, Hidetoshi and Furuta, Jun and Kobayashi, Kazutoshi and Onodera, Hidetoshi},
 book = {宇宙航空研究開発機構特別資料, JAXA Special Publication},
 month = {Mar},
 note = {We measured neutron-induced SEUs (Single Event Upsets) and MCUs (Multiple Cell Upsets) on FFs in a 65 nm bulk CMOS process. Measurement results show that maximum MCU / SEU ratio is 30.6% and is　exponentially decreased by the distance between latches on FFs., 形態: カラー図版あり, Physical characteristics: Original contains color illustrations, 資料番号: AA0061889034, レポート番号: JAXA-SP-12-008E},
 pages = {159--161},
 publisher = {宇宙航空研究開発機構(JAXA), Japan Aerospace Exploration Agency (JAXA)},
 title = {Measurement of Distance-dependent Multiple Upsets of Flip-Flops in 65nm CMOS Process},
 volume = {JAXA-SP-12-008E},
 year = {2013}
}