{"created":"2023-06-20T14:37:52.900458+00:00","id":4328,"links":{},"metadata":{"_buckets":{"deposit":"aa839ae3-dd92-4fe9-bc27-8084c95fef9f"},"_deposit":{"created_by":1,"id":"4328","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"4328"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00004328","sets":["1887:1891","9:789:888:898"]},"author_link":["19234","19230","19235","19232","19233","19231"],"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-03-29","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"161","bibliographicPageStart":"159","bibliographicVolumeNumber":"JAXA-SP-12-008E","bibliographic_titles":[{"bibliographic_title":"宇宙航空研究開発機構特別資料"},{"bibliographic_title":"JAXA Special Publication","bibliographic_titleLang":"en"}]}]},"item_5_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"We measured neutron-induced SEUs (Single Event Upsets) and MCUs (Multiple Cell Upsets) on FFs in a 65 nm bulk CMOS process. Measurement results show that maximum MCU / SEU ratio is 30.6% and is　exponentially decreased by the distance between latches on FFs.","subitem_description_type":"Other"}]},"item_5_description_18":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"形態: カラー図版あり","subitem_description_type":"Other"}]},"item_5_description_19":{"attribute_name":"内容記述（英）","attribute_value_mlt":[{"subitem_description":"Physical characteristics: Original contains color illustrations","subitem_description_type":"Other"}]},"item_5_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0061889034","subitem_description_type":"Other"}]},"item_5_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: JAXA-SP-12-008E","subitem_description_type":"Other"}]},"item_5_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙航空研究開発機構(JAXA)"}]},"item_5_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_5_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1349-113X","subitem_source_identifier_type":"ISSN"}]},"item_5_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11984031","subitem_source_identifier_type":"NCID"}]},"item_5_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"京都大学"},{"subitem_text_value":"京都工芸繊維大学 : 科学技術振興機構, CREST"},{"subitem_text_value":"京都大学 : 科学技術振興機構, CREST"}]},"item_5_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Kyoto University"},{"subitem_text_language":"en","subitem_text_value":"Kyoto Institute of Technology : JST, CREST"},{"subitem_text_language":"en","subitem_text_value":"Kyoto University : JST, CREST"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Furuta, Jun"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kobayashi, Kazutoshi"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Onodera, Hidetoshi"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Furuta, Jun","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kobayashi, Kazutoshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Onodera, Hidetoshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-16"}],"displaytype":"detail","filename":"61889034.pdf","filesize":[{"value":"383.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"61889034.pdf","url":"https://jaxa.repo.nii.ac.jp/record/4328/files/61889034.pdf"},"version_id":"70f2a3b2-a8b8-4821-aceb-255d0c21ab48"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Multiple Cell Upset","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Neutron irradiation","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Flip-Flops","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Measurement of Distance-dependent Multiple Upsets of Flip-Flops in 65nm CMOS Process","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Measurement of Distance-dependent Multiple Upsets of Flip-Flops in 65nm CMOS Process","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["898","1891"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"4328","relation_version_is_last":true,"title":["Measurement of Distance-dependent Multiple Upsets of Flip-Flops in 65nm CMOS Process"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T08:42:08.425508+00:00"}