{"created":"2023-06-20T14:37:52.965188+00:00","id":4329,"links":{},"metadata":{"_buckets":{"deposit":"27561006-daa3-4495-8a23-532c88133c00"},"_deposit":{"created_by":1,"id":"4329","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"4329"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00004329","sets":["1887:1891","9:789:888:898"]},"author_link":["19237","19243","19245","19244","19241","19239","19240","19242","19236","19238","19247","19246"],"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-03-29","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"165","bibliographicPageStart":"162","bibliographicVolumeNumber":"JAXA-SP-12-008E","bibliographic_titles":[{"bibliographic_title":"宇宙航空研究開発機構特別資料"},{"bibliographic_title":"JAXA Special Publication","bibliographic_titleLang":"en"}]}]},"item_5_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"Terrestrial neutrons cause single-event effects (SEEs) in semiconductor devices, which crucially affect the reliability of electronic systems used in the terrestrial environment. This paper presents evaluation results of high energy neutron-induced single-event burnout (SEB) in silicon carbide (SiC) power diodes and differences between SiC and silicon (Si) devices from the SEB standpoint.","subitem_description_type":"Other"}]},"item_5_description_18":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"形態: カラー図版あり","subitem_description_type":"Other"}]},"item_5_description_19":{"attribute_name":"内容記述（英）","attribute_value_mlt":[{"subitem_description":"Physical characteristics: Original contains color illustrations","subitem_description_type":"Other"}]},"item_5_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0061889035","subitem_description_type":"Other"}]},"item_5_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: 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Corporation (HIREC)"},{"subitem_text_language":"en","subitem_text_value":"High-Reliability Engineering & Components Corporation (HIREC)"},{"subitem_text_language":"en","subitem_text_value":"High-Reliability Engineering & Components Corporation (HIREC)"},{"subitem_text_language":"en","subitem_text_value":"High-Reliability Engineering & Components Corporation (HIREC)"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Asai, Hiroaki"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Sugimoto, Kenji"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nashiyama, Isamu"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shiba, Kensuke"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Matsuda, Mieko"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Morimura, Tadaaki"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Asai, Hiroaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Sugimoto, Kenji","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nashiyama, Isamu","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shiba, Kensuke","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Matsuda, Mieko","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Morimura, Tadaaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-16"}],"displaytype":"detail","filename":"61889035.pdf","filesize":[{"value":"220.0 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"61889035.pdf","url":"https://jaxa.repo.nii.ac.jp/record/4329/files/61889035.pdf"},"version_id":"82176f20-a5e9-4771-8268-6f7c13370657"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Silicon Carbide (SiC)","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Terrestrial Neutron","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Single-Event Burnout (SEB)","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"RCNP","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"LANSCE/WNR","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Evaluation of SiC Power Diodes against Terrestrial Neutron-Induced Failure at Ground Level","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Evaluation of SiC Power Diodes against Terrestrial Neutron-Induced Failure at Ground Level","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["898","1891"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"4329","relation_version_is_last":true,"title":["Evaluation of SiC Power Diodes against Terrestrial Neutron-Induced Failure at Ground Level"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T08:42:06.362055+00:00"}