@inproceedings{oai:jaxa.repo.nii.ac.jp:00004332,
 author = {Mikkola, Esko O. and Pandit, Viraj S. and Kim, Byoung Uk and Levy, Andrew and Mikkola, Esko O. and Pandit, Viraj S. and Kim, Byoung Uk and Levy, Andrew},
 book = {宇宙航空研究開発機構特別資料, JAXA Special Publication},
 month = {Mar},
 note = {Innovative Built-In Self-Test (BIST) circuit for monitoring Total Ionizing Dose (TID) radiation effects in Analog-to-Digital Converters (ADC) is presented., 形態: カラー図版あり, Physical characteristics: Original contains color illustrations, 資料番号: AA0061889038, レポート番号: JAXA-SP-12-008E},
 pages = {181--184},
 publisher = {宇宙航空研究開発機構(JAXA), Japan Aerospace Exploration Agency (JAXA)},
 title = {Built-In Self-Test Circuit for Total Ionizing Dose Radiation Effects in Analog-to-Digital Converters},
 volume = {JAXA-SP-12-008E},
 year = {2013}
}