{"created":"2023-06-20T14:37:53.160973+00:00","id":4332,"links":{},"metadata":{"_buckets":{"deposit":"beaffe87-af7f-4116-981d-61b7100ca873"},"_deposit":{"created_by":1,"id":"4332","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"4332"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00004332","sets":["1887:1891","9:789:888:898"]},"author_link":["19272","19270","19276","19269","19275","19273","19271","19274"],"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-03-29","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"184","bibliographicPageStart":"181","bibliographicVolumeNumber":"JAXA-SP-12-008E","bibliographic_titles":[{"bibliographic_title":"宇宙航空研究開発機構特別資料"},{"bibliographic_title":"JAXA Special Publication","bibliographic_titleLang":"en"}]}]},"item_5_description_17":{"attribute_name":"抄録(英)","attribute_value_mlt":[{"subitem_description":"Innovative Built-In Self-Test (BIST) circuit for monitoring Total Ionizing Dose (TID) radiation effects in Analog-to-Digital Converters (ADC) is presented.","subitem_description_type":"Other"}]},"item_5_description_18":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"形態: カラー図版あり","subitem_description_type":"Other"}]},"item_5_description_19":{"attribute_name":"内容記述(英)","attribute_value_mlt":[{"subitem_description":"Physical characteristics: Original contains color illustrations","subitem_description_type":"Other"}]},"item_5_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0061889038","subitem_description_type":"Other"}]},"item_5_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: JAXA-SP-12-008E","subitem_description_type":"Other"}]},"item_5_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙航空研究開発機構(JAXA)"}]},"item_5_publisher_9":{"attribute_name":"出版者(英)","attribute_value_mlt":[{"subitem_publisher":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_5_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1349-113X","subitem_source_identifier_type":"ISSN"}]},"item_5_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11984031","subitem_source_identifier_type":"NCID"}]},"item_5_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Ridgetop Group, Inc."},{"subitem_text_value":"Novellus Systems, Inc."},{"subitem_text_value":"Ridgetop Group, Inc."},{"subitem_text_value":"Ridgetop Group, Inc."}]},"item_5_text_7":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Ridgetop Group, Inc."},{"subitem_text_language":"en","subitem_text_value":"Novellus Systems, Inc."},{"subitem_text_language":"en","subitem_text_value":"Ridgetop Group, Inc."},{"subitem_text_language":"en","subitem_text_value":"Ridgetop Group, Inc."}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Mikkola, Esko O."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Pandit, Viraj S."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kim, Byoung Uk"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Levy, Andrew"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Mikkola, Esko O.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Pandit, Viraj S.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kim, Byoung Uk","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Levy, Andrew","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-16"}],"displaytype":"detail","filename":"61889038.pdf","filesize":[{"value":"171.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"61889038.pdf","url":"https://jaxa.repo.nii.ac.jp/record/4332/files/61889038.pdf"},"version_id":"bd2308d4-85f0-4b15-973d-d28547cbe64a"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Built-in self-test (BIST)","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Total ionizing dose (TID)","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Radiation Effects","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Analog-to-Digital Converter (ADC)","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Built-In Self-Test Circuit for Total Ionizing Dose Radiation Effects in Analog-to-Digital Converters","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Built-In Self-Test Circuit for Total Ionizing Dose Radiation Effects in Analog-to-Digital Converters","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["898","1891"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"4332","relation_version_is_last":true,"title":["Built-In Self-Test Circuit for Total Ionizing Dose Radiation Effects in Analog-to-Digital Converters"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T08:41:59.901643+00:00"}