@inproceedings{oai:jaxa.repo.nii.ac.jp:00004438,
 author = {櫻井, 和也 and 渡邉, 力夫 and 三宅, 弘晃 and 高橋, 眞人 and 奥村, 哲平 and Sakurai, Kazuya and Watanabe, Rikio and Miyake, Hiroaki and Takahashi, Masato and Okumura, Teppei},
 book = {宇宙航空研究開発機構特別資料: 第8回宇宙環境シンポジウム講演論文集, JAXA Special Publication: Proceedings of the 8th Spacecraft Environment Symposium},
 month = {Feb},
 note = {第8回宇宙環境シンポジウム (2011年10月18-19日. 東京国際展示場), 東京, 8th Spacecraft Enivironment Symposium (October 18-19, 2011, Tokyo Big Sight), Tokyo Japan, The purpose of this study is to build and validate a model of volume resistivity from the experimental results to analyze the influence of parameters such as electron beam energy and sample temperature. We established a measurement setup, called the charge storage method, which measures volume resistivity by analyzing the time history of a dielectric devices to investigate volume resistivity in the temperature range attained (from 260K to 320K). In this paper, we measured the volume resistivity. We analyzed the effect of sample thickness, electron beam irradiation energy and temperature. The dielectric material considered here is typical polyimide (Kapton(Reg. U.S.Pat. & Tm. Off.)) film. The experimental results indicate that higher electron energy and thinner sample thickness show lower resistivity .volume resistivity in dark current region decreases theoretically as the sample temperature increases. Moreover, we proposed the mechanism of charge accumulation in charge storage method., 形態: カラー図版あり, Physical characteristics: Original contains color illustrations, 資料番号: AA0065159019, レポート番号: JAXA-SP-11-012},
 pages = {143--148},
 publisher = {宇宙航空研究開発機構, Japan Aerospace Exploration Agency (JAXA)},
 title = {電子線照射された宇宙機用誘電体材料の体積抵抗率評価手法に関する研究},
 volume = {JAXA-SP-11-012},
 year = {2012}
}