{"created":"2023-06-20T14:37:59.147411+00:00","id":4438,"links":{},"metadata":{"_buckets":{"deposit":"1c56c8c9-dac6-4971-93ce-955835f24d47"},"_deposit":{"created_by":1,"id":"4438","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"4438"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00004438","sets":["1398:1485:1493","1543:1811:1819","1887:1891","9:789:906:910"]},"author_link":["20055","20049","20054","20053","20057","20058","20051","20052","20050","20056"],"item_5_alternative_title_2":{"attribute_name":"その他のタイトル（英）","attribute_value_mlt":[{"subitem_alternative_title":"Study on Evaluation method for Volume Resistivity of Dielectric material for Spacecraft Irradiated by Electron beam"}]},"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2012-02-20","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"148","bibliographicPageStart":"143","bibliographicVolumeNumber":"JAXA-SP-11-012","bibliographic_titles":[{"bibliographic_title":"宇宙航空研究開発機構特別資料: 第8回宇宙環境シンポジウム講演論文集"},{"bibliographic_title":"JAXA Special Publication: Proceedings of the 8th Spacecraft Environment Symposium","bibliographic_titleLang":"en"}]}]},"item_5_description_14":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第8回宇宙環境シンポジウム (2011年10月18-19日. 東京国際展示場), 東京","subitem_description_type":"Other"}]},"item_5_description_15":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）（英）","attribute_value_mlt":[{"subitem_description":"8th Spacecraft Enivironment Symposium (October 18-19, 2011, Tokyo Big Sight), Tokyo Japan","subitem_description_type":"Other"}]},"item_5_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"The purpose of this study is to build and validate a model of volume resistivity from the experimental results to analyze the influence of parameters such as electron beam energy and sample temperature. We established a measurement setup, called the charge storage method, which measures volume resistivity by analyzing the time history of a dielectric devices to investigate volume resistivity in the temperature range attained (from 260K to 320K). In this paper, we measured the volume resistivity. We analyzed the effect of sample thickness, electron beam irradiation energy and temperature. The dielectric material considered here is typical polyimide (Kapton(Reg. U.S.Pat. & Tm. Off.)) film. The experimental results indicate that higher electron energy and thinner sample thickness show lower resistivity .volume resistivity in dark current region decreases theoretically as the sample temperature increases. Moreover, we proposed the mechanism of charge accumulation in charge storage method.","subitem_description_type":"Other"}]},"item_5_description_18":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"形態: カラー図版あり","subitem_description_type":"Other"}]},"item_5_description_19":{"attribute_name":"内容記述（英）","attribute_value_mlt":[{"subitem_description":"Physical characteristics: Original contains color illustrations","subitem_description_type":"Other"}]},"item_5_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0065159019","subitem_description_type":"Other"}]},"item_5_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: JAXA-SP-11-012","subitem_description_type":"Other"}]},"item_5_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙航空研究開発機構"}]},"item_5_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_5_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1349-113X","subitem_source_identifier_type":"ISSN"}]},"item_5_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11984031","subitem_source_identifier_type":"NCID"}]},"item_5_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東京都市大学"},{"subitem_text_value":"東京都市大学"},{"subitem_text_value":"東京都市大学"},{"subitem_text_value":"宇宙航空研究開発機構 (JAXA)"},{"subitem_text_value":"宇宙航空研究開発機構 (JAXA)"}]},"item_5_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Tokyo City University"},{"subitem_text_language":"en","subitem_text_value":"Tokyo City University"},{"subitem_text_language":"en","subitem_text_value":"Tokyo City University"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency (JAXA)"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"櫻井, 和也"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"渡邉, 力夫"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"三宅, 弘晃"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"高橋, 眞人"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"奥村, 哲平"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Sakurai, Kazuya","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Watanabe, Rikio","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Miyake, Hiroaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takahashi, Masato","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Okumura, Teppei","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-16"}],"displaytype":"detail","filename":"65159019.pdf","filesize":[{"value":"463.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"65159019.pdf","url":"https://jaxa.repo.nii.ac.jp/record/4438/files/65159019.pdf"},"version_id":"a837cabb-6cc0-4376-9000-a4fdaf57dcf2"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Dielectrics","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Spacecraft Charging","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Volume resistivity","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Charge storage method","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Electron beam","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"電子線照射された宇宙機用誘電体材料の体積抵抗率評価手法に関する研究","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"電子線照射された宇宙機用誘電体材料の体積抵抗率評価手法に関する研究"}]},"item_type_id":"5","owner":"1","path":["910","1493","1819","1891"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"4438","relation_version_is_last":true,"title":["電子線照射された宇宙機用誘電体材料の体積抵抗率評価手法に関する研究"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T08:39:26.306597+00:00"}