@article{oai:jaxa.repo.nii.ac.jp:00046232,
 author = {Chung, C.-H. and 小林, 大輔 and 廣瀬, 和之 and Chung, C.-H. and Kobayashi, Daisuke and Hirose, Kazuyuki},
 issue = {4},
 journal = {IEEE Transactions on Device and Materials Reliability},
 month = {Dec},
 note = {Accepted: 2019-10-20, 資料番号: SA1190196000},
 pages = {751--756},
 title = {Understanding the Difference in Soft-Error Sensitivity of Back-Biased Thin-BOX SOI SRAMs to Space and Terrestrial Radiation},
 volume = {19},
 year = {2019}
}