{"created":"2023-06-20T15:16:08.169474+00:00","id":46232,"links":{},"metadata":{"_buckets":{"deposit":"4fd4ee64-dea5-4870-8c75-2b6a330548db"},"_deposit":{"created_by":1,"id":"46232","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"46232"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00046232","sets":["1887:1888"]},"author_link":["521332","521330","521327","521329","521331","521328"],"item_7_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2019-12","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicPageEnd":"756","bibliographicPageStart":"751","bibliographicVolumeNumber":"19","bibliographic_titles":[{},{"bibliographic_title":"IEEE Transactions on Device and Materials Reliability","bibliographic_titleLang":"en"}]}]},"item_7_description_19":{"attribute_name":"内容記述（英）","attribute_value_mlt":[{"subitem_description":"Accepted: 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