@article{oai:jaxa.repo.nii.ac.jp:00046233,
 author = {小林, 大輔 and 廣瀬, 和之 and 坂本, 敬太 and 岡本, 祥吾 and 馬場, 俊祐 and 新藤, 浩之 and 川崎, 治 and 牧野, 高紘 and 大島, 武 and Mori, Yoshiharu and 松浦, 大介 and Kusano, Masaki and 成田, 貴則 and 石井, 茂 and Kobayashi, Daisuke and Hirose, Kazuyuki and Sakamoto, Keita and Okamoto, Shogo and Baba, Shunsuke and Shindou, Hiroyuki and Kawasaki, Osamu and Makino, Takahiro and Ohshima, Takeshi and Mori, Yoshiharu and Matsuura, Daisuke and Kusano, Masaki and Narita, Takanori and Ishii, Shigeru},
 issue = {1},
 journal = {IEEE Transactions on Nuclear Science},
 month = {Jan},
 note = {著者人数: 14名, Accepted: 2019-11-26, 資料番号: SA1190197000},
 pages = {328--335},
 title = {Data-Retention-Voltage-Based Analysis of Systematic Variations in SRAM SEU Hardness: A Possible Solution to Synergistic Effects of TID},
 volume = {67},
 year = {2020}
}