@inproceedings{oai:jaxa.repo.nii.ac.jp:00004697,
 author = {櫻井, 和也 and 渡邉, 力夫 and 三宅, 弘晃 and 仁田, 工美 and Sakurai, Kazuya and Watanabe, Rikio and Miyake, Hiroaki and Nitta, Kumi},
 book = {宇宙航空研究開発機構特別資料: 第7回宇宙環境シンポジウム講演論文集, JAXA Special Publication: Proceedings of the 7th Spacecraft Enivironment Symposium},
 month = {Feb},
 note = {第7回宇宙環境シンポジウム (2010年10月19日-20日. 東京国際フォーラム), 7th Spacecraft Enivironment Symposium (October 19-20, 2010, Tokyo International Forum), Tokyo Japan, For determination of dielectric volume resistivty under space environment, it is important to understand the effect of test pammeters such as electron energy and sample temperature. In this paper, the effect of sample thickness, electron irradiation energy and temperature on volume resistivity is analyzed by the charge storage method. The dielectric material considered here is typical polyimide(Kapton) film. The experimental results indicate that higher electron energy and thinner sample thickness show lower resistivity. Higher temperatur also exhibits lower ressistivity according to the Boltzmann type resistivity decrease., 形態: カラー図版あり, Physical characteristics: Original contains color illustrations, 資料番号: AA0064933019, レポート番号: JAXA-SP-10-013},
 publisher = {宇宙航空研究開発機構, Japan Aerospace Exploration Agency (JAXA)},
 title = {電荷蓄積法による誘電体体積抵抗率におけるパラメータ依存性について},
 volume = {JAXA-SP-10-013},
 year = {2011}
}