{"created":"2023-06-20T14:38:12.558152+00:00","id":4697,"links":{},"metadata":{"_buckets":{"deposit":"bd5db170-36fb-413f-a437-5b61729add12"},"_deposit":{"created_by":1,"id":"4697","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"4697"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00004697","sets":["1398:1485:1494","1543:1811:1820","1887:1891","9:789:920:924"]},"author_link":["21239","21244","21238","21242","21243","21241","21240","21237"],"item_5_alternative_title_2":{"attribute_name":"その他のタイトル（英）","attribute_value_mlt":[{"subitem_alternative_title":"Experimental Parameter Dependency on Dielectric Volume Resistivity in Charge storage method"}]},"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2011-02-28","bibliographicIssueDateType":"Issued"},"bibliographicVolumeNumber":"JAXA-SP-10-013","bibliographic_titles":[{"bibliographic_title":"宇宙航空研究開発機構特別資料: 第7回宇宙環境シンポジウム講演論文集"},{"bibliographic_title":"JAXA Special Publication: Proceedings of the 7th Spacecraft Enivironment Symposium","bibliographic_titleLang":"en"}]}]},"item_5_description_14":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第7回宇宙環境シンポジウム (2010年10月19日-20日. 東京国際フォーラム)","subitem_description_type":"Other"}]},"item_5_description_15":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）（英）","attribute_value_mlt":[{"subitem_description":"7th Spacecraft Enivironment Symposium (October 19-20, 2010, Tokyo International Forum), Tokyo Japan","subitem_description_type":"Other"}]},"item_5_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"For determination of dielectric volume resistivty under space environment, it is important to understand the effect of test pammeters such as electron energy and sample temperature. In this paper, the effect of sample thickness, electron irradiation energy and temperature on volume resistivity is analyzed by the charge storage method. The dielectric material considered here is typical polyimide(Kapton) film. The experimental results indicate that higher electron energy and thinner sample thickness show lower resistivity. Higher temperatur also exhibits lower ressistivity according to the Boltzmann type resistivity decrease.","subitem_description_type":"Other"}]},"item_5_description_18":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"形態: カラー図版あり","subitem_description_type":"Other"}]},"item_5_description_19":{"attribute_name":"内容記述（英）","attribute_value_mlt":[{"subitem_description":"Physical characteristics: Original contains color illustrations","subitem_description_type":"Other"}]},"item_5_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0064933019","subitem_description_type":"Other"}]},"item_5_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: JAXA-SP-10-013","subitem_description_type":"Other"}]},"item_5_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙航空研究開発機構"}]},"item_5_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_5_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1349-113X","subitem_source_identifier_type":"ISSN"}]},"item_5_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11984031","subitem_source_identifier_type":"NCID"}]},"item_5_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東京都市大学"},{"subitem_text_value":"東京都市大学"},{"subitem_text_value":"東京都市大学"},{"subitem_text_value":"宇宙航空研究開発機構"}]},"item_5_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Tokyo City University"},{"subitem_text_language":"en","subitem_text_value":"Tokyo City University"},{"subitem_text_language":"en","subitem_text_value":"Tokyo City University"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"櫻井, 和也"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"渡邉, 力夫"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"三宅, 弘晃"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"仁田, 工美"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Sakurai, Kazuya","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Watanabe, Rikio","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Miyake, Hiroaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nitta, Kumi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-16"}],"displaytype":"detail","filename":"64933019.pdf","filesize":[{"value":"8.1 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"64933019.pdf","url":"https://jaxa.repo.nii.ac.jp/record/4697/files/64933019.pdf"},"version_id":"a257a001-2c0e-4a83-ab74-f560e542c80e"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Dielectrics","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Spacecraft Charglng","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Vblume resistivity","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Charge storage method","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"電荷蓄積法による誘電体体積抵抗率におけるパラメータ依存性について","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"電荷蓄積法による誘電体体積抵抗率におけるパラメータ依存性について"}]},"item_type_id":"5","owner":"1","path":["924","1494","1820","1891"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"4697","relation_version_is_last":true,"title":["電荷蓄積法による誘電体体積抵抗率におけるパラメータ依存性について"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T08:33:34.769188+00:00"}