@inproceedings{oai:jaxa.repo.nii.ac.jp:00004704,
 author = {陳, 玉 and 河野, 高範 and 増井, 博一 and 岩田, 稔 and 豊田, 和弘 and 趙, 孟佑 and Chen, Yu and Kono, Takanori and Masui, Hirokazu and Iwata, Minoru and Toyoda, Kazuhiro and Cho, Mengu},
 book = {宇宙航空研究開発機構特別資料: 第7回宇宙環境シンポジウム講演論文集, JAXA Special Publication: Proceedings of the 7th Spacecraft Enivironment Symposium},
 month = {Feb},
 note = {第7回宇宙環境シンポジウム (2010年10月19日-20日. 東京国際フォーラム), 7th Spacecraft Enivironment Symposium (October 19-20, 2010, Tokyo International Forum), Tokyo Japan, E-induced electron emission on the surface of space materials is a very important factor to understanding the spacecraft charging process. A single pulse yield measurement system for insulating material is developed. The electron yield results of Au specimen between DC yield test and pulse yield test are compared. Using the single pulse yield measurement system, the secondary electron emission yields of highly-insulating, 25microm thin Kapton H film have been measured for the incident primary beam energies, 300 <E(sub p)< 3000 eV., 形態: カラー図版あり, Physical characteristics: Original contains color illustrations, 資料番号: AA0064933026, レポート番号: JAXA-SP-10-013},
 pages = {197--201},
 publisher = {宇宙航空研究開発機構, Japan Aerospace Exploration Agency (JAXA)},
 title = {Development of e-Induced Electron Emission Pulse Yield Measurement System},
 volume = {JAXA-SP-10-013},
 year = {2011}
}