@inproceedings{oai:jaxa.repo.nii.ac.jp:00005096,
 author = {Gallo, L. C. and Ruel, S. and Zhu, S. and Kaspi, V.},
 book = {宇宙航空研究開発機構特別資料:, JAXA Special Publication: The Energetic Cosmos; from Suzaku to ASTRO-H},
 month = {Feb},
 note = {The 3rd Suzaku international Conference "Energetic Cosmos : from Suzaku to ASTRO-H" (June 29-July 2, 2009. Grand Park Otaru Hotel), Otaru, Hokkaido Japan, Metrology systems will play an increasingly important role in the design of future space telescopes. Long extendible benches and multiple spacecrafts flying in formation will be employed in order to create space-based interferometers and increased focal length. Determination of the optical bench alignment for these future observatories requires a sophisticated metrology system. Astro-H serves as a path-finder for many of these future missions in that it will possess an extendible optical bench for the hard X-ray telescopes and an advanced metrology system. One possible solution for the Astro-H metrology system is discussed here, as well as its applicability to the International X-ray Observatory (IXO)., Meeting sponsors: The University of Tokyo, The Institute of Physical and Chemical Research, The Japan Society for the Promotion of Science, 資料番号: AA0064574164, レポート番号: JAXA-SP-09-008E},
 pages = {424--425},
 publisher = {宇宙航空研究開発機構, Japan Aerospace Exploration Agency (JAXA)},
 title = {A Metrology System for Astro-H},
 volume = {JAXA-SP-09-008E},
 year = {2010}
}