@inproceedings{oai:jaxa.repo.nii.ac.jp:00005142,
 author = {櫻井, 和也 and 江面, 裕貴 and 森岡, 祐貴 and 渡邉, 力夫 and 目黒, 在 and 三宅, 弘晃 and 仁田, 工美 and Sakurai, Kazuya and Ezura, Yuki and Morioka, Yuki and Watanabe, Rikio and Meguro, Akira and Miyake, Hiroaki and Nitta, Kumi},
 book = {宇宙航空研究開発機構特別資料: 第6回「宇宙環境シンポジウム」講演論文集, JAXA Special Publication: Proceedings of the 6th Spacecraft Enivironment Symposium},
 month = {Feb},
 note = {第6回宇宙環境シンポジウム (2009年2月29日-30日. 北九州国際会議場), 6th Spacecraft Enivironment Symposium (February 29-30, 2009. Kitakyushu International Conference Center), A sample temperature control system using Peltier device is developed for volume resistivity measurement of dielectrics. Four Peltier devices are installed under a dielectric film to keep sample temperature from - 40 deg. to + 80 deg. As a result of heat conduction test under vacuum, we found that the temperature is controlled within 1 deg when the temperature setting is 80 deg, but in the case of negative temperature setting, the temperature does not decrease because heat dissipation is not adequate. We measured volume resistivity of polyimide film by a charge storage method with temperature variation. The results indicate that volume resistivity in dark current region decreases as the sample temperature increases as theoretically estimated., 形態: カラー図版あり, Physical characteristics: Original contains color illustrations, 資料番号: AA0064542025, レポート番号: JAXA-SP-09-006},
 publisher = {宇宙航空研究開発機構, Japan Aerospace Exploration Agency (JAXA)},
 title = {誘電体体積抵抗率計測時の温度可変システムについて},
 volume = {JAXA-SP-09-006},
 year = {2010}
}