{"created":"2023-06-20T14:38:37.356905+00:00","id":5202,"links":{},"metadata":{"_buckets":{"deposit":"4f95c4d4-d666-4e5d-be4d-680f21787e22"},"_deposit":{"created_by":1,"id":"5202","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"5202"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00005202","sets":["1398:1485:1496","1543:1811:1822","1887:1891","9:789:956:957"]},"author_link":["24961","24956","24959","24960","24958","24953","24955","24957","24954","24952"],"item_5_alternative_title_2":{"attribute_name":"その他のタイトル（英）","attribute_value_mlt":[{"subitem_alternative_title":"Measurement of distribution of photoemission current for some kinds of insulators"}]},"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2009-03-31","bibliographicIssueDateType":"Issued"},"bibliographicVolumeNumber":"JAXA-SP-08-018","bibliographic_titles":[{"bibliographic_title":"宇宙航空研究開発機構特別資料: 第5回「宇宙環境シンポジウム」講演論文集"},{"bibliographic_title":"JAXA Special Publication: Proceeding of the 5th Spacecraft Environment Symposium","bibliographic_titleLang":"en"}]}]},"item_5_description_14":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第5回宇宙環境シンポジウム(2008年12月18日-12月19日. つくば国際会議場）","subitem_description_type":"Other"}]},"item_5_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"Various materials such as the thermal control film, Paint-type coating materials, some kinds of insulators are used for artificial satellites. This report describes results of distributions of the photoemission current, for them excited by ultraviolet-light. The used film samples were two kinds of germanium coating materials. The painting samples were two kinds of white paint materials (inorganic conductive) which are used for the surface of antenna part in artificial satellite. Insulator samples are four materials (PIFE, Alumina, laminate board and soda glass). In addition, two composite samples which are composed of the metal and the insulator are prepared for the measurement of photoemission. The one is an insulator chip pasted on the metal board and the other is a metal chip pasted on an insulator board. The following measurement results were obtained. The photoemission current value of the Au sample around the insulator become smaller than that of metal samples. The distribution of photoemission current of the insulator on the metal influence around the insulator as well as other insulator samples. The photoemission current value of the metal chip on the insulator board is remarkably small as well as that of insulator material.","subitem_description_type":"Other"}]},"item_5_description_18":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"形態: カラー図版あり","subitem_description_type":"Other"}]},"item_5_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0064382013","subitem_description_type":"Other"}]},"item_5_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: JAXA-SP-08-018","subitem_description_type":"Other"}]},"item_5_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙航空研究開発機構"}]},"item_5_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_5_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1349-113X","subitem_source_identifier_type":"ISSN"}]},"item_5_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11984031","subitem_source_identifier_type":"NCID"}]},"item_5_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"埼玉大学"},{"subitem_text_value":"埼玉大学"},{"subitem_text_value":"埼玉大学"},{"subitem_text_value":"埼玉大学"},{"subitem_text_value":"宇宙航空研究開発機構"}]},"item_5_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Saitama University"},{"subitem_text_language":"en","subitem_text_value":"Saitama University"},{"subitem_text_language":"en","subitem_text_value":"Saitama University"},{"subitem_text_language":"en","subitem_text_value":"Saitama University"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"伊藤, 広和"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"生井, 諭司"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"山納, 康"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"小林, 信一"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"仁田, 工美"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ito, Hirokazu","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Namai, Satoshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yamano, Yasushi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kobayashi, Shinichi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nitta, Kumi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-16"}],"displaytype":"detail","filename":"64382013.pdf","filesize":[{"value":"1.6 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"64382013.pdf","url":"https://jaxa.repo.nii.ac.jp/record/5202/files/64382013.pdf"},"version_id":"56e211b9-0adb-4af0-97b7-e61ac96fe7ee"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"放出型電子顕微鏡、光電子放出、電子電流","subitem_subject_scheme":"Other"},{"subitem_subject":"Electron emission microscope, Photoelectron emission, electron current","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"各種絶縁材料の光電子放出電流分布の測定","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"各種絶縁材料の光電子放出電流分布の測定"}]},"item_type_id":"5","owner":"1","path":["957","1496","1822","1891"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"5202","relation_version_is_last":true,"title":["各種絶縁材料の光電子放出電流分布の測定"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T08:21:25.854069+00:00"}