@inproceedings{oai:jaxa.repo.nii.ac.jp:00005502,
 author = {野崎, 幸重 and 増井, 博一 and 豊田, 和弘 and Cho, Mengu and Nozaki, Yukishige and Masui, Hirokazu and Toyoda, Kazuhiro and Cho, Mengu},
 book = {宇宙航空研究開発機構特別資料: 第4回宇宙環境シンポジウム講演論文集, JAXA Special Publication: Proceedings of the 4th Spacecraft Environment Symposium},
 month = {Mar},
 note = {Recently many spacecraft use Triple-Junction (TJ) solar cells as their primary electrical power source because of their excellent efficiency. However it is also known that triple-junction solar cells are easy to be broken by a low reverse bias voltage. Therefore a discrete by-pass diode should be connected to every solar cell in parallel for the shadow protection. Under these circumstances, TJ solar cells with integrate Monolithic Diode (MD) have been introduced to market recently. In the CICing (Coverglass Interconnect Cell) of TJ solar cell with MD, cell-to-cell interconnector is connected on MD pad. The interconnector region forms triple-junction in orbit, making primary arc inception easy. Therefore, it is necessary to study the behavior of arcs on MD solar cell array. The result of the ESD (ElectroStatic Discharge) test for MD solar array revealed that the degradation of MD solar cell is caused by not only large current but also total energy of the discharge. The waveform seems to be affected by the impedance of the solar array circuit. This paper presents the recent results of ESD test for MD solar array and proposes further investigation based on the test results., 資料番号: AA0063997013, レポート番号: JAXA-SP-07-030},
 pages = {95--98},
 publisher = {宇宙航空研究開発機構, Japan Aerospace Exploration Agency (JAXA)},
 title = {ESD test for triple-junction solar cells with monolithic diode},
 volume = {JAXA-SP-07-030},
 year = {2008}
}