@inproceedings{oai:jaxa.repo.nii.ac.jp:00005505,
 author = {渡邉, 力夫 and 三宅, 弘晃 and 仁田, 工美 and Watanabe, Rikio and Miyake, Hiroaki and Nitta, Kumi},
 book = {宇宙航空研究開発機構特別資料: 第4回宇宙環境シンポジウム講演論文集, JAXA Special Publication: Proceedings of the 4th Spacecraft Environment Symposium},
 month = {Mar},
 note = {A new measurement method for volume resistivity of dielectric material has been tested and compared to the standard ASTM (American Society for Testing and Materials) 'capacitor method'. This is intended for obtaining resistivity values of highly insulated material for spacecraft surface under realistic condition which simulates vacuum and electron beam irradiation. The resistivity value is calculated from exponential decay time constant of surface potential after electron beam irradiation ceased. The results show that the resistivity value from present method is 10(exp 3) times larger than that obtained from capacitor method. This indicates that charged dielectrics need much longer field relaxation time which would cause reconsideration of current spacecraft design guideline and charge analysis., 資料番号: AA0063997016, レポート番号: JAXA-SP-07-030},
 pages = {105--106},
 publisher = {宇宙航空研究開発機構, Japan Aerospace Exploration Agency (JAXA)},
 title = {Estimation of volume resistivity of dielectric films under electron irradiation},
 volume = {JAXA-SP-07-030},
 year = {2008}
}