{"created":"2023-06-20T14:38:52.337789+00:00","id":5505,"links":{},"metadata":{"_buckets":{"deposit":"fe9973b0-3b3f-40db-bcc4-f4852ce4ba1f"},"_deposit":{"created_by":1,"id":"5505","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"5505"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00005505","sets":["1398:1485:1497","1543:1811:1823","1887:1891","9:789:972:973"]},"author_link":["26737","26738","26739","26736","26740","26741"],"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-03-31","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"106","bibliographicPageStart":"105","bibliographicVolumeNumber":"JAXA-SP-07-030","bibliographic_titles":[{"bibliographic_title":"宇宙航空研究開発機構特別資料: 第4回宇宙環境シンポジウム講演論文集"},{"bibliographic_title":"JAXA Special Publication: Proceedings of the 4th Spacecraft Environment Symposium","bibliographic_titleLang":"en"}]}]},"item_5_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"A new measurement method for volume resistivity of dielectric material has been tested and compared to the standard ASTM (American Society for Testing and Materials) 'capacitor method'. This is intended for obtaining resistivity values of highly insulated material for spacecraft surface under realistic condition which simulates vacuum and electron beam irradiation. The resistivity value is calculated from exponential decay time constant of surface potential after electron beam irradiation ceased. The results show that the resistivity value from present method is 10(exp 3) times larger than that obtained from capacitor method. This indicates that charged dielectrics need much longer field relaxation time which would cause reconsideration of current spacecraft design guideline and charge analysis.","subitem_description_type":"Other"}]},"item_5_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0063997016","subitem_description_type":"Other"}]},"item_5_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: JAXA-SP-07-030","subitem_description_type":"Other"}]},"item_5_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙航空研究開発機構"}]},"item_5_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_5_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1349-113X","subitem_source_identifier_type":"ISSN"}]},"item_5_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11984031","subitem_source_identifier_type":"NCID"}]},"item_5_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"武蔵工業大学"},{"subitem_text_value":"宇宙航空研究開発機構"},{"subitem_text_value":"宇宙航空研究開発機構"}]},"item_5_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Musashi Institute of Technology"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency (JAXA)"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"渡邉, 力夫"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"三宅, 弘晃"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"仁田, 工美"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Watanabe, Rikio","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Miyake, Hiroaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nitta, Kumi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-16"}],"displaytype":"detail","filename":"63997016.pdf","filesize":[{"value":"338.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"63997016.pdf","url":"https://jaxa.repo.nii.ac.jp/record/5505/files/63997016.pdf"},"version_id":"79038e2f-6c0f-4c13-a98c-29b36269f030"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"体積抵抗率","subitem_subject_scheme":"Other"},{"subitem_subject":"誘電体","subitem_subject_scheme":"Other"},{"subitem_subject":"電子照射","subitem_subject_scheme":"Other"},{"subitem_subject":"航空宇宙環境","subitem_subject_scheme":"Other"},{"subitem_subject":"衛星設計","subitem_subject_scheme":"Other"},{"subitem_subject":"宇宙機構造材料","subitem_subject_scheme":"Other"},{"subitem_subject":"電子ビーム","subitem_subject_scheme":"Other"},{"subitem_subject":"衛星表面","subitem_subject_scheme":"Other"},{"subitem_subject":"電場","subitem_subject_scheme":"Other"},{"subitem_subject":"ポリイミド","subitem_subject_scheme":"Other"},{"subitem_subject":"宇宙機帯電","subitem_subject_scheme":"Other"},{"subitem_subject":"volume resistivity","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"dielectric","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"electron irradiation","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"aerospace environment","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"satellite design","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"spacecraft construction material","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"electron beam","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"satellite surface","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"electric field","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"polyimide","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"spacecraft charging","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Estimation of volume resistivity of dielectric films under electron irradiation","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Estimation of volume resistivity of dielectric films under electron irradiation"}]},"item_type_id":"5","owner":"1","path":["973","1497","1823","1891"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"5505","relation_version_is_last":true,"title":["Estimation of volume resistivity of dielectric films under electron irradiation"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T08:13:28.431211+00:00"}