{"created":"2023-06-20T14:39:32.704956+00:00","id":6286,"links":{},"metadata":{"_buckets":{"deposit":"74ad44d9-f78c-4d97-be6f-457d5711a351"},"_deposit":{"created_by":1,"id":"6286","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"6286"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00006286","sets":["1887:1893","9:789:1031:1060"]},"author_link":["31705","31703","31706","31701","31704","31702"],"item_3_alternative_title_2":{"attribute_name":"その他のタイトル（英）","attribute_value_mlt":[{"subitem_alternative_title":"Study of internal bulk charge sensor: Measurement and analysis for chare accumulation in dielectric materials irradiated by proton beam"}]},"item_3_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2006-01-20","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"152","bibliographicPageStart":"147","bibliographicVolumeNumber":"JAXA-SP-05-008","bibliographic_titles":[{"bibliographic_title":"宇宙航空研究開発機構特別資料: 平成16年度総合技術研究本部宇宙領域宇宙科学研究本部合同研究成果報告書:人工衛星系基盤技術"},{"bibliographic_title":"JAXA Special Publication: FY2004 Report of Joint Research Achievements of the Space Division of Institute of Aerospace Technology and Institute of Space and Astronautical Science: Basic Technologies of Satellite Systems","bibliographic_titleLang":"en"}]}]},"item_3_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"Electrical charge accumulation characteristics in dielectric materials for a spacecraft panel have studied for understanding of spacecraft charging issue in high energy radiation environment. This study especially has focused on a spacecraft charging accident caused by internal charge accumulation in dielectric materials irradiated by proton beam. The internal charge accumulation of those bulks measurement was carried out using Pulsed Electro-Acoustic (PEA) method. As the results, we obtained a positive charge accumulation in the bulk of samples after proton beam irradiation. However, it was not observed a positive charge accumulation that a quartz glass has an Al evaporated layer on the surface of proton beam irradiation side. Therefore, in this paper, we compare between the PEA's internal charge measurement results and energy band model because of we discus the charge formation mechanism in the bulk irradiated by proton beam.","subitem_description_type":"Other"}]},"item_3_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0049054030","subitem_description_type":"Other"}]},"item_3_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: JAXA-SP-05-008","subitem_description_type":"Other"}]},"item_3_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙航空研究開発機構"}]},"item_3_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_3_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1349-113X","subitem_source_identifier_type":"ISSN"}]},"item_3_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11984031","subitem_source_identifier_type":"NCID"}]},"item_3_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"宇宙航空研究開発機構 総合技術研究本部"},{"subitem_text_value":"宇宙航空研究開発機構 総合技術研究本部"},{"subitem_text_value":"宇宙航空研究開発機構 総合技術研究本部"}]},"item_3_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency Institute of Space Technology and Aeronautics"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency Institute of Space Technology and Aeronautics"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency Institute of Space Technology and Aeronautics"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"三宅, 弘晃"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"松本, 晴久"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"五家, 建夫"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Miyake, Hiroaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Matsumoto, Haruhisa","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Goka, Tateo","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-16"}],"displaytype":"detail","filename":"49054030.pdf","filesize":[{"value":"1.6 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"49054030.pdf","url":"https://jaxa.repo.nii.ac.jp/record/6286/files/49054030.pdf"},"version_id":"c5e244b1-bb98-4d77-9425-e9c514a07354"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"宇宙機帯電","subitem_subject_scheme":"Other"},{"subitem_subject":"内部帯電センサ","subitem_subject_scheme":"Other"},{"subitem_subject":"帯電","subitem_subject_scheme":"Other"},{"subitem_subject":"絶縁材料","subitem_subject_scheme":"Other"},{"subitem_subject":"プロトン照射","subitem_subject_scheme":"Other"},{"subitem_subject":"パルス静電応力法","subitem_subject_scheme":"Other"},{"subitem_subject":"石英ガラス","subitem_subject_scheme":"Other"},{"subitem_subject":"ポリメチルメタクリレート","subitem_subject_scheme":"Other"},{"subitem_subject":"spacecraft charging","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"internal bulk charge sensor","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"charge accumulation","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"dielectric material","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"proton irradiation","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"pulsed electroacoustic method","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"quartz glass","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"polymethyl methacrylate","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"technical report","resourceuri":"http://purl.org/coar/resource_type/c_18gh"}]},"item_title":"内部帯電センサの研究:プロトン照射絶縁材料の帯電計測および解析","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"内部帯電センサの研究:プロトン照射絶縁材料の帯電計測および解析"}]},"item_type_id":"3","owner":"1","path":["1060","1893"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"6286","relation_version_is_last":true,"title":["内部帯電センサの研究:プロトン照射絶縁材料の帯電計測および解析"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T07:58:30.214580+00:00"}