@techreport{oai:jaxa.repo.nii.ac.jp:00006296,
 author = {岡, 克己 and 久保山, 智司 and 松田, 純夫 and Oka, Katsumi and Kuboyama, Satoshi and Matsuda, Sumio},
 month = {Jan},
 note = {It outlines the LSI-process diagnosis technology which screens the commercial components for high-reliability space applications. The inspection of the failure-included lot was performed, and the validity of this technique was examined recursively. As a result, some advantages of contributing to more definitive diagnosis were shown., 資料番号: AA0049054040, レポート番号: JAXA-SP-05-008},
 title = {LSIプロセス診断技術による民生用半導体部品の評価},
 year = {2006}
}