{"created":"2023-06-20T14:39:33.477979+00:00","id":6300,"links":{},"metadata":{"_buckets":{"deposit":"8935763b-5518-44b4-b259-eaddfa135270"},"_deposit":{"created_by":1,"id":"6300","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"6300"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00006300","sets":["1887:1893","9:789:1031:1060"]},"author_link":["31824","31819","31821","31826","31822","31827","31820","31828","31825","31818","31817","31823"],"item_3_alternative_title_2":{"attribute_name":"その他のタイトル（英）","attribute_value_mlt":[{"subitem_alternative_title":"HBD methodology that promotes space application of COTS"}]},"item_3_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2006-01-20","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"216","bibliographicPageStart":"211","bibliographicVolumeNumber":"JAXA-SP-05-008","bibliographic_titles":[{"bibliographic_title":"宇宙航空研究開発機構特別資料: 平成16年度総合技術研究本部宇宙領域宇宙科学研究本部合同研究成果報告書:人工衛星系基盤技術"},{"bibliographic_title":"JAXA Special Publication: FY2004 Report of Joint Research Achievements of the Space Division of Institute of Aerospace Technology and Institute of Space and Astronautical Science: Basic Technologies of Satellite Systems","bibliographic_titleLang":"en"}]}]},"item_3_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"Hardness-By-Design (HBD) approach for 0.15 micrometer fully depleted CMOS/SOI process was studied. We designed logic cells hardened for SEU/SET and performed the irradiation tests in order to evaluate the effectiveness of this methodology. Excellent hardness was achieved, and it is thought that state-of-the-art parts can be applied to space by using this technique.","subitem_description_type":"Other"}]},"item_3_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0049054044","subitem_description_type":"Other"}]},"item_3_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: JAXA-SP-05-008","subitem_description_type":"Other"}]},"item_3_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙航空研究開発機構"}]},"item_3_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_3_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1349-113X","subitem_source_identifier_type":"ISSN"}]},"item_3_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11984031","subitem_source_identifier_type":"NCID"}]},"item_3_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"宇宙航空研究開発機構 総合技術研究本部"},{"subitem_text_value":"宇宙航空研究開発機構 総合技術研究本部"},{"subitem_text_value":"宇宙航空研究開発機構 総合技術研究本部"},{"subitem_text_value":"宇宙航空研究開発機構 総合技術研究本部"},{"subitem_text_value":"宇宙航空研究開発機構 総合技術研究本部"},{"subitem_text_value":"宇宙航空研究開発機構 総合技術研究本部"}]},"item_3_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency Institute of Space Technology and Aeronautics"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency Institute of Space Technology and Aeronautics"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency Institute of Space Technology and Aeronautics"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency Institute of Space Technology and Aeronautics"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency Institute of Space Technology and Aeronautics"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency Institute of Space Technology and Aeronautics"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"新藤, 浩之"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"浅井, 弘彰"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"池田, 直美"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"山田, 理子"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"久保山, 智司"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"松田, 純夫"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shindo, Hiroyuki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Asai, Hiroaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ikeda, Naomi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yamada, Noriko","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kuboyama, Satoshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Matsuda, Sumio","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-16"}],"displaytype":"detail","filename":"49054044.pdf","filesize":[{"value":"939.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"49054044.pdf","url":"https://jaxa.repo.nii.ac.jp/record/6300/files/49054044.pdf"},"version_id":"f6c913d9-b1f8-4572-beaa-139bb1716f65"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Hardness-By-Design手法","subitem_subject_scheme":"Other"},{"subitem_subject":"照射試験","subitem_subject_scheme":"Other"},{"subitem_subject":"CMOS/SOIプロセス","subitem_subject_scheme":"Other"},{"subitem_subject":"航空宇宙環境","subitem_subject_scheme":"Other"},{"subitem_subject":"宇宙線","subitem_subject_scheme":"Other"},{"subitem_subject":"放射線耐性","subitem_subject_scheme":"Other"},{"subitem_subject":"シングルイベントアップセット","subitem_subject_scheme":"Other"},{"subitem_subject":"LSI","subitem_subject_scheme":"Other"},{"subitem_subject":"Hardness-By-Design approach","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"irradiation test","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"CMOS/SOI process","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"aerospace environment","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"cosmic ray","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"radiation tolerance","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"single event upset","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"LSI","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"technical report","resourceuri":"http://purl.org/coar/resource_type/c_18gh"}]},"item_title":"民生部品を生かすHBD技術","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"民生部品を生かすHBD技術"}]},"item_type_id":"3","owner":"1","path":["1060","1893"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"6300","relation_version_is_last":true,"title":["民生部品を生かすHBD技術"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T07:58:12.229360+00:00"}