{"created":"2023-06-20T14:39:34.951158+00:00","id":6332,"links":{},"metadata":{"_buckets":{"deposit":"6822ed62-ed47-4298-801d-116c18c39782"},"_deposit":{"created_by":1,"id":"6332","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"6332"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00006332","sets":["1887:1891","9:789:1031:1066"]},"author_link":["32026","32027","32028"],"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-08-01","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"138","bibliographicPageStart":"132","bibliographicVolumeNumber":"JAXA-SP-05-001E","bibliographic_titles":[{"bibliographic_title":"宇宙航空研究開発機構特別資料"},{"bibliographic_title":"JAXA Special Publication: 9th Spacecraft Charging Technology Conference","bibliographic_titleLang":"en"}]}]},"item_5_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"Resistivity values were experimentally determined using charge storage methods for six samples remaining from the construction of the Internal Discharge Monitor (IDM) flown on the Combined Release and Radiation Effects Satellite (CRRES). Three tests were performed over a period of four to five weeks each in a vacuum of approximately 5 x 10(exp -6) torr with an average temperature of approximately 25 C to simulate a space environment. Samples tested included FR4, PTFE, and alumina with copper electrodes attached to one or more of the sample surfaces. FR4 circuit board material was found to have a dark current resistivity of approximately 1 x 10(exp 18) Ohm-cm and a moderately high polarization current. Fiber filled PTFE exhibited little polarization current and a dark current resistivity of approximately 3 x 10(exp 20) Ohm-cm. Alumina had a measured dark current resistivity of approximately 3 x 10(exp 17) Ohm-cm, with a very large and more rapid polarization. Experimentally determined resistivity values were two to three orders of magnitude more than found using standard ASTM test methods. The one minute wait time suggested for the standard ASTM tests is much shorter than the measured polarization current decay times for each sample indicating that the primary currents used to determine ASTM resistivity are caused by the polarization of molecules in the applied electric field rather than charge transport through the bulk of the dielectric. Testing over much longer periods of time in vacuum is required to allow this polarization current to decay away and to allow the observation of charged particles transport through a dielectric material. Application of a simple physics-based model allows separation of the polarization current and dark current components from long duration measurements of resistivity over day- to month-long time scales. Model parameters are directly related to the magnitude of charge transfer and storage and the rate of charge transport.","subitem_description_type":"Other"}]},"item_5_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0049206017","subitem_description_type":"Other"}]},"item_5_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: JAXA-SP-05-001E","subitem_description_type":"Other"}]},"item_5_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙航空研究開発機構"}]},"item_5_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_5_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1349-113X","subitem_source_identifier_type":"ISSN"}]},"item_5_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11984031","subitem_source_identifier_type":"NCID"}]},"item_5_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"California Institute of Technology Jet Propulsion Laboratory"},{"subitem_text_value":"California Institute of Technology Jet Propulsion Laboratory"},{"subitem_text_value":"Utah State University Physics Department"}]},"item_5_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"California Institute of Technology Jet Propulsion Laboratory"},{"subitem_text_language":"en","subitem_text_value":"California Institute of Technology Jet Propulsion Laboratory"},{"subitem_text_language":"en","subitem_text_value":"Utah State University Physics Department"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Green, Nelson W.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Frederickson, A. Robb","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Dennison, J. R.","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-16"}],"displaytype":"detail","filename":"49206017.pdf","filesize":[{"value":"1.3 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"49206017.pdf","url":"https://jaxa.repo.nii.ac.jp/record/6332/files/49206017.pdf"},"version_id":"2866ba6a-5815-44d4-820c-4c205b80628a"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"宇宙機帯電","subitem_subject_scheme":"Other"},{"subitem_subject":"航空宇宙環境","subitem_subject_scheme":"Other"},{"subitem_subject":"誘電体","subitem_subject_scheme":"Other"},{"subitem_subject":"抵抗率","subitem_subject_scheme":"Other"},{"subitem_subject":"暗電流","subitem_subject_scheme":"Other"},{"subitem_subject":"電場","subitem_subject_scheme":"Other"},{"subitem_subject":"荷電粒子","subitem_subject_scheme":"Other"},{"subitem_subject":"分極","subitem_subject_scheme":"Other"},{"subitem_subject":"spacecraft charging","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"aerospace environment","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"dielectric","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"resistivity","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"dark current","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"electric field","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"charged particle","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"polarization","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Experimentally derived resistivity for dielectric samples from the CRRES Internal Discharge Monitor","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Experimentally derived resistivity for dielectric samples from the CRRES Internal Discharge Monitor","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["1066","1891"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"6332","relation_version_is_last":true,"title":["Experimentally derived resistivity for dielectric samples from the CRRES Internal Discharge Monitor"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T07:57:42.967763+00:00"}