@inproceedings{oai:jaxa.repo.nii.ac.jp:00006342,
 author = {奥村, 哲平 and 細田, 聡史 and Kim, Jeongho and Cho, Mengu and 香河, 英史 and Okumura, Teppei and Hosoda, Satoshi and Kim, Jeongho and Cho, Mengu and Kagawa, Hideshi},
 book = {宇宙航空研究開発機構特別資料, JAXA Special Publication: 9th Spacecraft Charging Technology Conference},
 month = {Aug},
 note = {When we operate solar array at high voltage (greater than 100 V) in LEO environment, arcing occurs on the solar array surface. The solar cell can suffer degradation of electric performance due to only one arc with some probability. We performed degradation test of solar array coupons against arcing under simulated LEO environment in order to identify the threshold of arc energy to cause the solar cell degradation. The solar array coupons are made of silicon solar cells. The LCR circuit was attached to a solar array coupon through a vacuum chamber. In order to change trigger arc energy, we changed the value of capacitance of LCR circuit. The electric performance was measured inside the chamber without opening the chamber. The threshold of arc energy was identified. The arcing which has enough energy to cause the solar cell degradation may occur on solar array of 100 V satellite in Low Earth Orbit environment., 資料番号: AA0049206027, レポート番号: JAXA-SP-05-001E},
 pages = {210--221},
 publisher = {宇宙航空研究開発機構, Japan Aerospace Exploration Agency (JAXA)},
 title = {Degradation of solar cell electric performance due to arcing in LEO plasma environment},
 volume = {JAXA-SP-05-001E},
 year = {2005}
}