{"created":"2023-06-20T14:39:36.526335+00:00","id":6359,"links":{},"metadata":{"_buckets":{"deposit":"9f438ade-3841-407d-8205-b72d3320be52"},"_deposit":{"created_by":1,"id":"6359","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"6359"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00006359","sets":["1887:1891","9:789:1031:1066"]},"author_link":["32232","32235","32233","32231","32230","32234"],"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-08-01","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"367","bibliographicPageStart":"353","bibliographicVolumeNumber":"JAXA-SP-05-001E","bibliographic_titles":[{"bibliographic_title":"宇宙航空研究開発機構特別資料"},{"bibliographic_title":"JAXA Special Publication: 9th Spacecraft Charging Technology Conference","bibliographic_titleLang":"en"}]}]},"item_5_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"Tests of arcing and current collection in simulated space plasma conditions have been performed at the NASA Glenn Research Center (GRC) in Cleveland, Ohio, for over 30 years and at the Marshall Space Flight Center (MSFC) in Huntsville, Alabama, for almost as long. During this period, proper test conditions for accurate and meaningful space simulation have been worked out, comparisons with actual space performance in space flight tests and with real operational satellites have been made, and NASA has achieved our own internal standards for test protocols. It is the purpose of this paper to communicate the test conditions, test procedures, and types of analysis used at NASA GRC and MSFC to the space environmental testing community at large, to help with international space-plasma arcing-testing standardization. To be discussed are: 1. Neutral pressures, neutral gases, and vacuum chamber sizes. 2. Electron and ion densities, plasma uniformity, sample sizes, and Debye lengths. 3. Biasing samples versus self-generated voltages. Floating samples versus grounded. 4. Power supplies and current limits. Isolation of samples from power supplies during arcs. 5. Arc circuits. Capacitance during biased arc-threshold tests. Capacitance during sustained arcing and damage tests. Arc detection. Preventing sustained discharges during testing. 6. Real array or structure samples versus idealized samples. 7. Validity of LEO tests for GEO samples. 8. Extracting arc threshold information from arc rate versus voltage tests. 9. Snapover and current collection at positive sample bias. Glows at positive bias. Kapton pyrolysis. 10. Trigger arc thresholds. Sustained arc thresholds. Paschen discharge during sustained arcing. 11. Testing for Paschen discharge thresholds. Testing for dielectric breakdown thresholds. Testing for tether arcing. 12. Testing in very dense plasmas (i.e., thruster plumes). 13. Arc mitigation strategies. Charging mitigation strategies. Models 14. Analysis of test results. Finally, the necessity of testing will be emphasized, not to the exclusion of modeling, but as part of a complete strategy for determining when and if arcs will occur, and preventing them from occurring in space.","subitem_description_type":"Other"}]},"item_5_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0049206044","subitem_description_type":"Other"}]},"item_5_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: JAXA-SP-05-001E","subitem_description_type":"Other"}]},"item_5_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙航空研究開発機構"}]},"item_5_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_5_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1349-113X","subitem_source_identifier_type":"ISSN"}]},"item_5_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11984031","subitem_source_identifier_type":"NCID"}]},"item_5_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"NASA, Marshall Space Flight Center"},{"subitem_text_value":"Ohio Aerospace Institute"},{"subitem_text_value":"NASA, Glenn Research Center"},{"subitem_text_value":"NASA, Glenn Research Center"},{"subitem_text_value":"NASA, Marshall Space Flight Center"},{"subitem_text_value":"NASA, Marshall Space Flight Center"}]},"item_5_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"NASA, Marshall Space Flight Center"},{"subitem_text_language":"en","subitem_text_value":"Ohio Aerospace Institute"},{"subitem_text_language":"en","subitem_text_value":"NASA, Glenn Research Center"},{"subitem_text_language":"en","subitem_text_value":"NASA, Glenn Research Center"},{"subitem_text_language":"en","subitem_text_value":"NASA, Marshall Space Flight Center"},{"subitem_text_language":"en","subitem_text_value":"NASA, Marshall Space Flight Center"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Ferguson, Dale C.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Vayner, Boris V.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Galofaro, Joel T.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hillard, G. Barry","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Vaughn, Jason","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Schneider, Todd","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-16"}],"displaytype":"detail","filename":"49206044.pdf","filesize":[{"value":"2.1 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"49206044.pdf","url":"https://jaxa.repo.nii.ac.jp/record/6359/files/49206044.pdf"},"version_id":"cd7e4684-faeb-4c43-8526-978ee4e1f677"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"宇宙機帯電","subitem_subject_scheme":"Other"},{"subitem_subject":"航空宇宙環境","subitem_subject_scheme":"Other"},{"subitem_subject":"静電放電","subitem_subject_scheme":"Other"},{"subitem_subject":"地上試験","subitem_subject_scheme":"Other"},{"subitem_subject":"宇宙環境シミュレーション","subitem_subject_scheme":"Other"},{"subitem_subject":"宇宙プラズマ","subitem_subject_scheme":"Other"},{"subitem_subject":"標準化","subitem_subject_scheme":"Other"},{"subitem_subject":"研究施設","subitem_subject_scheme":"Other"},{"subitem_subject":"spacecraft charging","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"aerospace environment","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"electrostatic discharge","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"ground test","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"space environment simulation","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"space plasma","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"standardization","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"research facility","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"NASA GRC and MSFC space-plasma arc testing procedures","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"NASA GRC and MSFC space-plasma arc testing procedures","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["1066","1891"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"6359","relation_version_is_last":true,"title":["NASA GRC and MSFC space-plasma arc testing procedures"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T07:57:12.833779+00:00"}