@inproceedings{oai:jaxa.repo.nii.ac.jp:00006653,
 author = {奥村, 哲平 and 細田, 聡史 and Kim, Joengho and 豊田, 和弘 and Cho, Mengu and Okumura, Teppei and Hosoda, Satoshi and Kim, Joengho and Toyoda, Kazuhiro and Cho, Mengu},
 book = {宇宙航空研究開発機構特別資料: 宇宙インフラストラクチャ研究会　宇宙環境計測技術WG:第6回宇宙飛翔体環境研究会報告書, JAXA Special Publication: Proceedings of the 6th Spacecraft Environment Research Network Meeting},
 month = {Mar},
 note = {A degradation test for a solar array coupon against ESD was performed under stimulated Low Earth Orbit environment. All tests were performed in a vacuum chamber with a plasma source. A test coupon was biased at - 400 V with the aim of developing the next generation 400 V high voltage solar array. The LCR circuit was used in order to simulate the arc current gathering the charge stored on coverglass. Tests were repeated until the solar array coupon was damaged. All of arc spots and waveforms were detected. The electrical performance of the coupon was measured after every test without opening the vacuum chamber. Many arcs occurred and caused the cell degradation. The cell was damaged by only one arc that occurred at the edge of cell, not at electrode., 資料番号: AA0046978008, レポート番号: JAXA-SP-03-001},
 pages = {43--48},
 publisher = {宇宙航空研究開発機構, Japan Aerospace Exploration Agency (JAXA)},
 title = {低地球軌道環境における宇宙用太陽電池の放電による電気性能低下},
 volume = {JAXA-SP-03-001},
 year = {2004}
}