{"created":"2023-06-20T14:39:50.474175+00:00","id":6655,"links":{},"metadata":{"_buckets":{"deposit":"709c048f-c7f0-48be-b22a-19b1e9b182ed"},"_deposit":{"created_by":1,"id":"6655","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"6655"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00006655","sets":["1887:1891","9:789:1085:1367"]},"author_link":["34107","34105","34099","34098","34109","34103","34111","34110","34097","34106","34108","34102","34100","34096","34101","34104"],"item_5_alternative_title_2":{"attribute_name":"その他のタイトル（英）","attribute_value_mlt":[{"subitem_alternative_title":"The measurement of surface charge distribution on Kapton film using Pockels effect"}]},"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004-03-01","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"58","bibliographicPageStart":"53","bibliographicVolumeNumber":"JAXA-SP-03-001","bibliographic_titles":[{"bibliographic_title":"宇宙航空研究開発機構特別資料: 宇宙インフラストラクチャ研究会　宇宙環境計測技術WG:第6回宇宙飛翔体環境研究会報告書"},{"bibliographic_title":"JAXA Special Publication: Proceedings of the 6th Spacecraft Environment Research Network Meeting","bibliographic_titleLang":"en"}]}]},"item_5_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"Spacecraft in space environment are exposed in plasma or are irradiated by high energy cosmic rays. Dielectric materials on the surface of spacecraft are usually charged up in such environment. The accident gives on unrecoverable damage to the spacecraft. Therefore it is necessary to analyze the mechanism of surface charge distribution on insulating materials in space environment. The measurement system has been developed for surface discharge pattern on BSO cell which is used as an image detecting device applying Pockels effect. By using this optical method, the 2-dimensional charge distribution can be measured during surface discharge. Furthermore with high speed CCD camera, the time dependent 2-dimensional images can be detected. Here, typical results of surface charges on Kapton film putting on BSO cell will be shown.","subitem_description_type":"Other"}]},"item_5_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0046978010","subitem_description_type":"Other"}]},"item_5_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: JAXA-SP-03-001","subitem_description_type":"Other"}]},"item_5_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙航空研究開発機構"}]},"item_5_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_5_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1349-113X","subitem_source_identifier_type":"ISSN"}]},"item_5_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11984031","subitem_source_identifier_type":"NCID"}]},"item_5_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"武蔵工業大学"},{"subitem_text_value":"武蔵工業大学"},{"subitem_text_value":"武蔵工業大学"},{"subitem_text_value":"武蔵工業大学"},{"subitem_text_value":"武蔵工業大学"},{"subitem_text_value":"武蔵工業大学"},{"subitem_text_value":"武蔵工業大学"},{"subitem_text_value":"芝浦工業大学"}]},"item_5_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Musashi Institute of Technology"},{"subitem_text_language":"en","subitem_text_value":"Musashi Institute of Technology"},{"subitem_text_language":"en","subitem_text_value":"Musashi Institute of Technology"},{"subitem_text_language":"en","subitem_text_value":"Musashi Institute of Technology"},{"subitem_text_language":"en","subitem_text_value":"Musashi Institute of Technology"},{"subitem_text_language":"en","subitem_text_value":"Musashi Institute of Technology"},{"subitem_text_language":"en","subitem_text_value":"Musashi Institute of Technology"},{"subitem_text_language":"en","subitem_text_value":"Shibaura Institute of Technology"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"梅村, 宗央"}],"nameIdentifiers":[{"nameIdentifier":"34096","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"村中, 国宏"}],"nameIdentifiers":[{"nameIdentifier":"34097","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"田中, 康寛"}],"nameIdentifiers":[{"nameIdentifier":"34098","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"深尾, 正"}],"nameIdentifiers":[{"nameIdentifier":"34099","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"高田, 達雄"}],"nameIdentifiers":[{"nameIdentifier":"34100","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"渡辺, 力夫"}],"nameIdentifiers":[{"nameIdentifier":"34101","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"冨田, 信之"}],"nameIdentifiers":[{"nameIdentifier":"34102","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"室岡, 義広"}],"nameIdentifiers":[{"nameIdentifier":"34103","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Umemura, Kazuhisa","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"34104","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Muranaka, Kunihiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"34105","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tanaka, Yasuhiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"34106","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Fukao, Tadashi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"34107","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takada, Tatsuo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"34108","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Watanabe, Rikio","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"34109","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tomita, Nobuyuki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"34110","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Murooka, Yoshihiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"34111","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-16"}],"displaytype":"detail","filename":"46978010.pdf","filesize":[{"value":"2.0 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"46978010.pdf","url":"https://jaxa.repo.nii.ac.jp/record/6655/files/46978010.pdf"},"version_id":"a490599c-d68b-47af-a669-bb50a9f86b54"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"表面電荷分布","subitem_subject_scheme":"Other"},{"subitem_subject":"Kaptonフィルム","subitem_subject_scheme":"Other"},{"subitem_subject":"ポッケルス効果","subitem_subject_scheme":"Other"},{"subitem_subject":"宇宙機環境","subitem_subject_scheme":"Other"},{"subitem_subject":"航空宇宙環境","subitem_subject_scheme":"Other"},{"subitem_subject":"宇宙線","subitem_subject_scheme":"Other"},{"subitem_subject":"宇宙機帯電","subitem_subject_scheme":"Other"},{"subitem_subject":"surface charge distribution","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Kapton film","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Pockels effect","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"spacecraft environment","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"aerospace environment","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"cosmic ray","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"spacecraft charging","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"ポッケルス効果を用いたKaptonフィルム上の表面帯電分布計測","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"ポッケルス効果を用いたKaptonフィルム上の表面帯電分布計測"}]},"item_type_id":"5","owner":"1","path":["1367","1891"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"6655","relation_version_is_last":true,"title":["ポッケルス効果を用いたKaptonフィルム上の表面帯電分布計測"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T07:51:34.756909+00:00"}