| Item type |
会議発表論文 / Conference Paper(1) |
| 公開日 |
2015-03-26 |
| タイトル |
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タイトル |
高温環境における宇宙用太陽電池セル劣化のフォトルミネッセンス解析 |
| 言語 |
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言語 |
jpn |
| 資源タイプ |
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資源タイプ識別子 |
http://purl.org/coar/resource_type/c_5794 |
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資源タイプ |
conference paper |
| アクセス権 |
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アクセス権 |
metadata only access |
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アクセス権URI |
http://purl.org/coar/access_right/c_14cb |
| その他のタイトル（英） |
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その他のタイトル |
Degradation Analysis of InGaP/GaAs/Ge Triple-junction Solar Cells in High-temperature and High-light- intensity Environments by Luminescence Techniques |
| 著者 |
豊田, 裕之
岩井, 隆晃
田島, 道夫
今泉, 充
Toyota, Hiroyuki
Iwai, Takaaki
Tajima, Michio
Imaizumi, Mitsuru
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| 著者所属 |
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宇宙航空研究開発機構宇宙科学研究本部 |
| 著者所属 |
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宇宙航空研究開発機構宇宙科学研究本部 : 明治大学 |
| 著者所属 |
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宇宙航空研究開発機構宇宙科学研究本部 |
| 著者所属 |
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宇宙航空研究開発機構研究開発本部 |
| 著者所属（英） |
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en |
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Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS) |
| 著者所属（英） |
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en |
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Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS) : Meiji University |
| 著者所属（英） |
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en |
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Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS) |
| 著者所属（英） |
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en |
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Aerospace Research and Development Directorate, Japan Aerospace Exploration Agency (JAXA) |
| 出版者 |
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出版者 |
宇宙航空研究開発機構宇宙科学研究本部 |
| 出版者（英） |
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出版者 |
Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA) |
| 書誌情報 |
宇宙エネルギーシンポジウム
en : Space Energy Symposium
巻 29,
発行日 2010-02
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| 会議概要（会議名, 開催地, 会期, 主催者等） |
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内容記述タイプ |
Other |
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内容記述 |
第29回宇宙エネルギーシンポジウム(2010年2月26日, 宇宙航空研究開発機構宇宙科学研究本部相模原キャンパス) |
| 会議概要（会議名, 開催地, 会期, 主催者等）（英） |
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内容記述タイプ |
Other |
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内容記述 |
The twenty-ninth Space Energy Symposium (February 26, 2010, Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency, Sagamihara) |
| 抄録（英） |
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内容記述タイプ |
Other |
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内容記述 |
The Institute of Space and Astronautical Science (ISAS) of JAXA is developing two inner-planetary probes: a Venus probe PLANET-C and a Mercury probe MMO. Intense sunlight due to shorter distance to the sun imposes requirements for light-intensity and temperature tolerance on their solar cells. We have been evaluating durability of InGaP/GaAs/Ge triple-junction (3J) solar cells from SHARP Corp. under such environments in two ways: forward current application tests and continuous operation tests.In the forward current application test, we passed current corresponding to two suns of illumination through the solar cells at 200C assuming the PLANET-C condition for 1615 h, which equals to 3230 equivalent solar hours (ESH). This test can be a simple alternative to an actual operation test, though the solar cells operate as LEDs. The maximum power (P(sub max)) of the solar cells declined by 3-6% after the test.In the continuous operation test, we illuminated the solar cells with 9.4 suns of AM 0 light at 230C assuming the MMO condition for 325 h, which equals to 3055 ESH, in a vacuum chamber. This test was a faithful reproduction of the actual environment in contrast to the forward current application test. No significant degradation in P(sub max) was observed after the test.These test results suggested that forward current application causes larger degradation than actual solar cell operation. To examine the difference in detail, we diagnosed the solar cells by photoluminescence (PL) spectroscopy. We applied a selective excitation PL method, which enables separate inspection of each subcell at 4.2 K.PL spectra from InGaP top cells consisted of the band-edge emission at 1.96 eV and 50-80 meV lower energy level. The intensity of these emissions was degraded after the forward current application test, but was not degraded after the continuous operation test. This result agreed with the change in P(sub max)max after the two kinds of degradation tests.PL spectra from GaAs middle cells consisted of the band-edge emission at 1.52 eV, the exciton emission at 1.49 eV, the donor-to-acceptor pair emission at 1.47 eV and its phonon sideband at 1.44 eV. The intensity of the band-edge emission was degraded after the forward current application test, but was not degraded after the continuous operation test in the same manner as the InGaP top cells. This result agreed with the change in P(sub max) after the two kinds of degradation tests. The intensity of the other emissions from GaAs middle cells were degraded after both degradation tests. We will clarify the degradation mechanisms in the future works. |
| 内容記述 |
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内容記述タイプ |
Other |
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内容記述 |
形態: カラー図版あり |
| 内容記述 |
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内容記述タイプ |
Other |
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内容記述 |
形態: CD-ROM1枚 |
| 内容記述（英） |
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内容記述タイプ |
Other |
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内容記述 |
Physical characteristics: Original contains color illustrations |
| 内容記述（英） |
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内容記述タイプ |
Other |
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内容記述 |
Note: One CD-ROM |
| 書誌レコードID |
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収録物識別子タイプ |
NCID |
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収録物識別子 |
AN10324356 |
| 資料番号 |
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内容記述タイプ |
Other |
|
内容記述 |
資料番号: AA0064737003 |
