Tokyo City University
Tokyo City University
Tokyo City University
Tokyo City University
Tokyo City University
Tokyo City University
Japan Aerospace Exploration Agency (JAXA)
出版者
宇宙航空研究開発機構
出版者（英）
Japan Aerospace Exploration Agency (JAXA)
雑誌名
宇宙航空研究開発機構特別資料: 第6回「宇宙環境シンポジウム」講演論文集
雑誌名(英)
JAXA Special Publication: Proceedings of the 6th Spacecraft Enivironment Symposium
A sample temperature control system using Peltier device is developed for volume resistivity measurement of dielectrics. Four Peltier devices are installed under a dielectric film to keep sample temperature from - 40 deg. to + 80 deg. As a result of heat conduction test under vacuum, we found that the temperature is controlled within 1 deg when the temperature setting is 80 deg, but in the case of negative temperature setting, the temperature does not decrease because heat dissipation is not adequate. We measured volume resistivity of polyimide film by a charge storage method with temperature variation. The results indicate that volume resistivity in dark current region decreases as the sample temperature increases as theoretically estimated.
内容記述
形態: カラー図版あり
内容記述（英）
Physical characteristics: Original contains color illustrations
誘電体体積抵抗率計測時の温度可変システムについて
64542025.pdf
(690.8KB)
