Kyushu Institute of Technology Department of Electrical Engineering, Faculty of Engineering
Kyushu Institute of Technology Department of Electrical Engineering, Faculty of Engineering
Kyushu Institute of Technology Department of Electrical Engineering, Faculty of Engineering
Kyushu Institute of Technology Department of Electrical Engineering, Faculty of Engineering
Japan Aerospace Exploration Agency
出版者
宇宙航空研究開発機構
出版者（英）
Japan Aerospace Exploration Agency (JAXA)
雑誌名
宇宙航空研究開発機構特別資料
雑誌名(英)
JAXA Special Publication: 9th Spacecraft Charging Technology Conference
巻
JAXA-SP-05-001E
ページ
210 - 221
発行年
2005-08-01
抄録（英）
When we operate solar array at high voltage (greater than 100 V) in LEO environment, arcing occurs on the solar array surface. The solar cell can suffer degradation of electric performance due to only one arc with some probability. We performed degradation test of solar array coupons against arcing under simulated LEO environment in order to identify the threshold of arc energy to cause the solar cell degradation. The solar array coupons are made of silicon solar cells. The LCR circuit was attached to a solar array coupon through a vacuum chamber. In order to change trigger arc energy, we changed the value of capacitance of LCR circuit. The electric performance was measured inside the chamber without opening the chamber. The threshold of arc energy was identified. The arcing which has enough energy to cause the solar cell degradation may occur on solar array of 100 V satellite in Low Earth Orbit environment.
Degradation of solar cell electric performance due to arcing in LEO plasma environment
49206027.pdf
(3.85MB)
