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for Postirradiation Gate-Stress Test", "subitem_title_language": "en"}]}, "item_type_id": "7", "owner": "1", "path": ["1888"], "permalink_uri": "https://jaxa.repo.nii.ac.jp/records/23043", "pubdate": {"attribute_name": "公開日", "attribute_value": "2019-10-25"}, "publish_date": "2019-10-25", "publish_status": "0", "recid": "23043", "relation": {}, "relation_version_is_last": true, "title": ["Physical Analysis of Damage Sites Introduced by SEGR in Silicon Vertical Power MOSFETs and Implications for Postirradiation Gate-Stress Test"], "weko_shared_id": -1}
Physical Analysis of Damage Sites Introduced by SEGR in Silicon Vertical Power MOSFETs and Implications for Postirradiation Gate-Stress Test
https://jaxa.repo.nii.ac.jp/records/23043
https://jaxa.repo.nii.ac.jp/records/230437d2a7e4b-4c61-4152-8698-7365bf835ecd
Item type | 学術雑誌論文 / Journal Article(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2019-10-25 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Physical Analysis of Damage Sites Introduced by SEGR in Silicon Vertical Power MOSFETs and Implications for Postirradiation Gate-Stress Test | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | Postgate stress | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | power MOSFETs | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | radiation damage | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | single-event gate rupture (SEGR) | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
久保山, 智司
× 久保山, 智司× 水田, 栄一× 仲田, 祐希× 新藤, 浩之× Kuboyama, Satoshi× Mizuta, Eiichi× Nakada, Yuki× Shindou, Hiroyuki |
|||||
著者所属 | ||||||
宇宙航空研究開発機構(JAXA) | ||||||
著者所属 | ||||||
宇宙航空研究開発機構(JAXA) | ||||||
著者所属 | ||||||
宇宙航空研究開発機構(JAXA) | ||||||
著者所属 | ||||||
宇宙航空研究開発機構(JAXA) | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency (JAXA) | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency (JAXA) | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency (JAXA) | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency (JAXA) | ||||||
出版者(英) | ||||||
出版者 | Institute of Electrical and Electronics Engineers (IEEE) | |||||
書誌情報 |
en : IEEE Transactions on Nuclear Science 巻 66, 号 7, p. 1710-1714, 発行日 2019-03-05 |
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内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 形態: カラー図版あり | |||||
内容記述(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Physical characteristics: Original contains color illustrations | |||||
内容記述(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Accepted: 2019-02-21 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0018-9499 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA00667999 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | http://dx.doi.org/10.1109/TNS.2019.2902871 | |||||
関連名称 | info:doi/10.1109/TNS.2019.2902871 | |||||
資料番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 資料番号: PA1910060000 |